Andrew J. Copperhall

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Redwood City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test-response comparison circuit and scan data transfer scheme in a...
- Patent number 10,891,884
- Issue date Jan 12, 2021
- Apple Inc.
- Bo Yang
- G01 - MEASURING TESTING
Information Patent Grant
Hardware assisted scheme for testing memories using scan
- Patent number 9,892,802
- Issue date Feb 13, 2018
- Apple Inc.
- Bo Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Compressed scan testing techniques
- Patent number 9,519,026
- Issue date Dec 13, 2016
- Apple Inc.
- Bibo Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPRESSED SCAN TESTING TECHNIQUES
- Publication number 20160091564
- Publication date Mar 31, 2016
- Apple Inc.
- Bibo Li
- G01 - MEASURING TESTING