Andrew J. ILOTT

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Rahway, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for magnetic resonance mapping of physical and ch...
- Patent number 11,921,067
- Issue date Mar 5, 2024
- New York University
- Alexej Jerschow
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for super-resolution surface-layer microscopy u...
- Patent number 10,712,297
- Issue date Jul 14, 2020
- New York University
- Alexej Jerschow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MAGNETIC RESONANCE MAPPING OF PHYSICAL AND CH...
- Publication number 20240248052
- Publication date Jul 25, 2024
- NEW YORK UNIVERSITY
- Alexej JERSCHOW
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MAGNETIC RESONANCE MAPPING OF PHYSICAL AND CH...
- Publication number 20190310211
- Publication date Oct 10, 2019
- NEW YORK UNIVERSITY
- Alexej JERSCHOW
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SUPER-RESOLUTION SURFACE-LAYER MICROSCOPY U...
- Publication number 20180052123
- Publication date Feb 22, 2018
- NEW YORK UNIVERSITY
- Alexej JERSCHOW
- G01 - MEASURING TESTING