Andrew James Cross

Person

Altrincham, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Sensitivity improvement of optical and SEM defection inspection
- Patent number 12,066,763
- Issue date Aug 20, 2024
- KLA Corporation
- Kaushik Sah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection sensitivity improvements for optical and electron beam i...
- Patent number 11,092,893
- Issue date Aug 17, 2021
- KLA Corporation
- Andrew Cross
- G01 - MEASURING TESTING
Information Patent Grant
Guided scanning electron microscopy metrology based on wafer topogr...
- Patent number 10,957,608
- Issue date Mar 23, 2021
- KLA-Tencor Corporation
- Arpit Yati
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using stochastic failure metrics in semiconductor manufacturing
- Patent number 10,818,001
- Issue date Oct 27, 2020
- KLA-Tencor Corporation
- Wing-Shan Ribi Leung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying nuisances and defects of interest in defects detected o...
- Patent number 10,699,926
- Issue date Jun 30, 2020
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology guided inspection sample shaping of optical inspection re...
- Patent number 10,598,617
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for systematic and stoc...
- Patent number 10,262,408
- Issue date Apr 16, 2019
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for weak pattern quantification
- Patent number 10,262,831
- Issue date Apr 16, 2019
- KLA-Tencor Corporation
- Andrew Cross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aware system, method and computer program product for detecting ove...
- Patent number 10,068,323
- Issue date Sep 4, 2018
- KLA-Tencor Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESS WINDOW QUALIFICATION MODULATION LAYOUTS
- Publication number 20230175983
- Publication date Jun 8, 2023
- KLA Corporation
- Andrew CROSS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR IMPROVING OPTICAL INSPECTION AND METROLOGY IMAGE QUALIT...
- Publication number 20220270212
- Publication date Aug 25, 2022
- KLA Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSITIVITY IMPROVEMENT OF OPTICAL AND SEM DEFECTION INSPECTION
- Publication number 20220244648
- Publication date Aug 4, 2022
- Kaushik Sah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SENSITIVITY IMPROVEMENTS FOR OPTICAL AND ELECTRON BEAM I...
- Publication number 20200183283
- Publication date Jun 11, 2020
- KLA Corporation
- Andrew Cross
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
USING STOCHASTIC FAILURE METRICS IN SEMICONDUCTOR MANUFACTURING
- Publication number 20200082523
- Publication date Mar 12, 2020
- KLA-Tencor Corporation
- Wing-Shan Ribi Leung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Identifying Nuisances and Defects of Interest in Defects Detected o...
- Publication number 20190067060
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Guided Inspection Sample Shaping of Optical Inspection Re...
- Publication number 20180321168
- Publication date Nov 8, 2018
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING
Information Patent Application
Guided Metrology Based on Wafer Topography
- Publication number 20180315670
- Publication date Nov 1, 2018
- KLA-Tencor Corporation
- Arpit Yati
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR SYSTEMATIC AND STOC...
- Publication number 20180300870
- Publication date Oct 18, 2018
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Weak Pattern Quantification
- Publication number 20180174797
- Publication date Jun 21, 2018
- KLA-Tencor Corporation
- Andrew Cross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN AWARE SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DETECT...
- Publication number 20170294012
- Publication date Oct 12, 2017
- KLA-Tencor Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING

Andrew James Cross

Person

Patents Grantslast 30 patents

Sensitivity improvement of optical and SEM defection inspection

Inspection sensitivity improvements for optical and electron beam i...

Guided scanning electron microscopy metrology based on wafer topogr...

Using stochastic failure metrics in semiconductor manufacturing

Identifying nuisances and defects of interest in defects detected o...

Metrology guided inspection sample shaping of optical inspection re...

System, method and computer program product for systematic and stoc...

Method and system for weak pattern quantification

Aware system, method and computer program product for detecting ove...

Patents Applicationslast 30 patents

PROCESS WINDOW QUALIFICATION MODULATION LAYOUTS

METHODS FOR IMPROVING OPTICAL INSPECTION AND METROLOGY IMAGE QUALIT...

SENSITIVITY IMPROVEMENT OF OPTICAL AND SEM DEFECTION INSPECTION

INSPECTION SENSITIVITY IMPROVEMENTS FOR OPTICAL AND ELECTRON BEAM I...

USING STOCHASTIC FAILURE METRICS IN SEMICONDUCTOR MANUFACTURING

Identifying Nuisances and Defects of Interest in Defects Detected o...

Metrology Guided Inspection Sample Shaping of Optical Inspection Re...

Guided Metrology Based on Wafer Topography

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR SYSTEMATIC AND STOC...

Method and System for Weak Pattern Quantification

DESIGN AWARE SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DETECT...