Andrew James PFAU

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrochemical deposition system including optical probes
- Patent number 12,180,607
- Issue date Dec 31, 2024
- Lam Research Corporation
- Andrew James Pfau
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Systems and methods for in-situ measurement of sheet resistance on...
- Patent number 12,105,039
- Issue date Oct 1, 2024
- Lam Research Corporation
- Manish Ranjan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
ELECTROCHEMICAL DEPOSITION SYSTEM INCLUDING OPTICAL PROBES
- Publication number 20250122639
- Publication date Apr 17, 2025
- LAM RESEARCH CORPORATION
- Andrew James PFAU
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
SYSTEMS AND METHODS FOR IN-SITU MEASUREMENT OF SHEET RESISTANCE ON...
- Publication number 20250003908
- Publication date Jan 2, 2025
- LAM RESEARCH CORPORATION
- Manish Ranjan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS
- Publication number 20240055282
- Publication date Feb 15, 2024
- LAM RESEARCH CORPORATION
- Liu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU MONITORING OF SUBSTRATE SURFACES
- Publication number 20220349850
- Publication date Nov 3, 2022
- LAM RESEARCH CORPORATION
- Manish Ranjan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ELECTROCHEMICAL DEPOSITION SYSTEM INCLUDING OPTICAL PROBES
- Publication number 20220228287
- Publication date Jul 21, 2022
- LAM RESEARCH CORPORATION
- Andrew James PFAU
- G01 - MEASURING TESTING
Information Patent Application
IMPROVING SUBSTRATE WETTABILITY FOR PLATING OPERATIONS
- Publication number 20210366768
- Publication date Nov 25, 2021
- LAM RESEARCH CORPORATION
- Zhian HE
- H01 - BASIC ELECTRIC ELEMENTS

Andrew James PFAU

Person

Patents Grantslast 30 patents

Electrochemical deposition system including optical probes

Systems and methods for in-situ measurement of sheet resistance on...

Patents Applicationslast 30 patents

ELECTROCHEMICAL DEPOSITION SYSTEM INCLUDING OPTICAL PROBES

SYSTEMS AND METHODS FOR IN-SITU MEASUREMENT OF SHEET RESISTANCE ON...

SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS

IN-SITU MONITORING OF SUBSTRATE SURFACES

ELECTROCHEMICAL DEPOSITION SYSTEM INCLUDING OPTICAL PROBES

IMPROVING SUBSTRATE WETTABILITY FOR PLATING OPERATIONS