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Andrew Lagodzinski
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Livermore, CA, US
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last 30 patents
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Patent Grant
Methods and systems for selecting wafer locations to characterize c...
Patent number
12,085,515
Issue date
Sep 10, 2024
KLA Corporation
Brian C. Lin
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Calibration Of Parametric Measurement Models Based On In-Line Wafer...
Publication number
20240102941
Publication date
Mar 28, 2024
KLA Corporation
Brian C. Lin
G01 - MEASURING TESTING
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Patent Application
Methods And Systems For Selecting Wafer Locations To Characterize C...
Publication number
20230063102
Publication date
Mar 2, 2023
KLA Corporation
Brian C. Lin
G01 - MEASURING TESTING