Andrew Lu

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for overlay shift determination
- Patent number 7,550,303
- Issue date Jun 23, 2009
- International Business Machines Corporation
- Patricia Argandona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection analysis system and method for circuit design
- Patent number 7,475,368
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Matthew S. Angyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for overlay shift determination
- Patent number 7,084,427
- Issue date Aug 1, 2006
- International Business Machines Corporation
- Patricia Argandona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse structure and method to form the same
- Patent number 6,927,472
- Issue date Aug 9, 2005
- International Business Machines Corporation
- David K. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse structure and method to form the same
- Patent number 6,924,185
- Issue date Aug 2, 2005
- International Business Machines Corporation
- David K. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for printing marks on the edges of wafers
- Patent number 6,908,830
- Issue date Jun 21, 2005
- International Business Machines Corporation
- Andrew Lu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Process-robust alignment mark structure for semiconductor wafers
- Patent number 6,803,668
- Issue date Oct 12, 2004
- International Business Machines Corporation
- Karen L. Holloway
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via masked line first dual damascene
- Patent number 6,372,647
- Issue date Apr 16, 2002
- International Business Machines Corporation
- Andrew Lu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Deflection analysis system and method for circuit design
- Publication number 20070174796
- Publication date Jul 26, 2007
- International Business Machines Corporation
- Matthew S. Angyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR OVERLAY SHIFT DETERMINATION
- Publication number 20060175319
- Publication date Aug 10, 2006
- International Business Machines Corporation
- Patricia Argandona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR OVERLAY SHIFT DETERMINATION
- Publication number 20050019966
- Publication date Jan 27, 2005
- International Business Machines Corporation
- Patricia Argandona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR PRINTING MARKS ON THE EDGES OF WAFERS
- Publication number 20040259322
- Publication date Dec 23, 2004
- International Business Machines Corporation
- Andrew Lu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process-robust alignment mark structure for semiconductor wafers
- Publication number 20040099963
- Publication date May 27, 2004
- International Business Machines Corporation
- Karen L. Holloway
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuse structure and method to form the same
- Publication number 20040070049
- Publication date Apr 15, 2004
- David K. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuse structure and method to form the same
- Publication number 20030089962
- Publication date May 15, 2003
- International Business Machines Corporation
- David K. Anderson
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Systems and methods for overlay shift determination

Deflection analysis system and method for circuit design

Systems and methods for overlay shift determination

Fuse structure and method to form the same

Fuse structure and method to form the same

Method for printing marks on the edges of wafers

Process-robust alignment mark structure for semiconductor wafers

Via masked line first dual damascene

Patents Applicationslast 30 patents

Deflection analysis system and method for circuit design

SYSTEMS AND METHODS FOR OVERLAY SHIFT DETERMINATION

SYSTEMS AND METHODS FOR OVERLAY SHIFT DETERMINATION

A METHOD FOR PRINTING MARKS ON THE EDGES OF WAFERS

Process-robust alignment mark structure for semiconductor wafers

Fuse structure and method to form the same

Fuse structure and method to form the same