Andrew Mark Woolfrey

Person

Wotton-Under-Edge, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Optical slit
- Patent number 7,170,595
- Issue date Jan 30, 2007
- Renishaw, PLC
- Brian John Edward Smith
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and spectroscopy system
- Patent number 6,885,445
- Issue date Apr 26, 2005
- Renishaw PLC
- Robert Bennett
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC APPARATUS AND METHODS FOR DETERMINING COMPONENTS PRES...
- Publication number 20160252459
- Publication date Sep 1, 2016
- RENISHAW PLC
- Ian M. BELL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING PERFORMANCE OF A SPECTROSCOPY SYSTEM
- Publication number 20150062575
- Publication date Mar 5, 2015
- RENISHAW PLC
- Thomas Thurston
- G01 - MEASURING TESTING
Information Patent Application
DYE SETS FOR SURFACE ENHANCED RESONANT RAMAN SPECTROSCOPY
- Publication number 20150064705
- Publication date Mar 5, 2015
- RENISHAW DIAGNOSTICS LIMITED
- Alastair Ricketts
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MAGNETIC RESONANCE APPARATUS AND METHOD
- Publication number 20110006771
- Publication date Jan 13, 2011
- RENISHAW PLC
- Christopher Paul Randell
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE POSITIONING APPARATUS
- Publication number 20090310215
- Publication date Dec 17, 2009
- RENISHAW PLC
- Victor Gordon Stimpson
- G02 - OPTICS
Information Patent Application
Electron microscope and spectroscopy system
- Publication number 20030053048
- Publication date Mar 20, 2003
- RENISHAW PLC
- Robert Bennett
- G01 - MEASURING TESTING
Information Patent Application
Indexing mechanism
- Publication number 20020017161
- Publication date Feb 14, 2002
- RENISHAW PLC
- Andrew M. Woolfrey
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Andrew Mark Woolfrey

Person

Patents Grantslast 30 patents

Optical slit

Electron microscope and spectroscopy system

Patents Applicationslast 30 patents

SPECTROSCOPIC APPARATUS AND METHODS FOR DETERMINING COMPONENTS PRES...

METHOD FOR MEASURING PERFORMANCE OF A SPECTROSCOPY SYSTEM

DYE SETS FOR SURFACE ENHANCED RESONANT RAMAN SPECTROSCOPY

MAGNETIC RESONANCE APPARATUS AND METHOD

SAMPLE POSITIONING APPARATUS

Electron microscope and spectroscopy system

Indexing mechanism