Andrew Marshall

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thin film molecular memory
- Patent number 12,063,788
- Issue date Aug 13, 2024
- Nutech Ventures
- Peter A. Dowben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoelectric majority gate device
- Patent number 11,764,786
- Issue date Sep 19, 2023
- Board of Regents of the University of Nebraska
- Nishtha Sharma Gaul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoelectric XNOR logic gate device
- Patent number 11,757,449
- Issue date Sep 12, 2023
- BOARD OF REGENT'S OF THE UNIVERSITY OF NEBRASKA
- Nishtha Sharma Gaul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoelectric inverter
- Patent number 11,658,663
- Issue date May 23, 2023
- Board of Regents of the University of Nebraska
- Nishtha Sharma Gaul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuits based on magnetoelectric transistor devices
- Patent number 11,349,480
- Issue date May 31, 2022
- Board of Regents, The University of Texas System
- Nishtha Sharma Gaul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unipolar magnetoelectric magnetic tunnel junction
- Patent number 10,177,303
- Issue date Jan 8, 2019
- Board of Regents, The University of Texas System
- Nishtha Sharma
- G11 - INFORMATION STORAGE
Information Patent Grant
Mismatch correction in differential amplifiers using analog floatin...
- Patent number 9,787,263
- Issue date Oct 10, 2017
- Texas Instruments Incorporated
- Ujas Natvarlal Patel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method to match SOI transistors using a local heater element
- Patent number 9,735,172
- Issue date Aug 15, 2017
- Texas Instruments Incorporated
- Andrew Marshall
- G05 - CONTROLLING REGULATING
Information Patent Grant
Configurable exclusive-OR / exclusive-NOR gate using magneto-electr...
- Patent number 9,692,413
- Issue date Jun 27, 2017
- The Research Foundation for The State University of New York
- Jonathan P. Bird
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Capacitor combination stress testing
- Patent number 9,678,132
- Issue date Jun 13, 2017
- Texas Instruments Incorporated
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Grant
Exclusive-OR gate using magneto-electric tunnel junctions
- Patent number 9,503,085
- Issue date Nov 22, 2016
- The Research Foundation for The State University of New York
- Jonathan Paul Bird
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Non-volatile latch using magneto-electric and ferro-electric tunnel...
- Patent number 9,368,208
- Issue date Jun 14, 2016
- Board of Regents, The University of Texas System
- Andrew Marshall
- G11 - INFORMATION STORAGE
Information Patent Grant
Majority- and minority-gate logic schemes based on magneto-electric...
- Patent number 9,276,040
- Issue date Mar 1, 2016
- Board of Regents of the University of Nebraska
- Andrew Marshall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method to match SOI transistors using a local heater element
- Patent number 9,276,012
- Issue date Mar 1, 2016
- Texas Instruments Incorporated
- Andrew Marshall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body bias coordinator, method of coordinating a body bias and sub-c...
- Patent number 9,124,263
- Issue date Sep 1, 2015
- Texas Instruments Incorporated
- Theodore W. Houston
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test circuit allowing precision analysis of delta performance degra...
- Patent number 9,052,360
- Issue date Jun 9, 2015
- Texas Instruments Incorporated
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Grant
Wireless authorization mechanism for mobile devices and data thereon
- Patent number 8,868,922
- Issue date Oct 21, 2014
- Texas Instruments Incorporated
- Andrew Marshall
- G07 - CHECKING-DEVICES
Information Patent Grant
Precision measurement of capacitor mismatch
- Patent number 8,686,744
- Issue date Apr 1, 2014
- Texas Instruments Incorporated
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Grant
SOI MuGFETs having single gate electrode level
- Patent number 8,581,317
- Issue date Nov 12, 2013
- Texas Instruments Incorporated
- Howard Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Frequency doubler/inverter
- Patent number 8,519,753
- Issue date Aug 27, 2013
- Texas Instruments Incorporated
- Andrew Marshall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Programmable circuit with carbon nanotube
- Patent number 8,455,305
- Issue date Jun 4, 2013
- Texas Instruments Incorporated
- Andrew Marshall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit allowing precision analysis of delta performance degra...
- Patent number 8,304,263
- Issue date Nov 6, 2012
- Texas Instruments Incorporated
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Grant
Differential input for ambipolar devices
- Patent number 8,258,868
- Issue date Sep 4, 2012
- Texas Instruments Incorporated
- Andrew Marshall
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Temperature responsive back bias control for integrated circuit
- Patent number 8,217,322
- Issue date Jul 10, 2012
- Texas Instruments Incorporated
- Theodore W. Houston
- G05 - CONTROLLING REGULATING
Information Patent Grant
Integrated circuits with split gate and common gate FinFET transistors
- Patent number 8,174,058
- Issue date May 8, 2012
- Texas Instruments Incorporated
- Andrew Marshall
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with memory cell including MuGFET and FIN capacitor
- Patent number 8,067,792
- Issue date Nov 29, 2011
- Texas Instruments Incorporated
- Weize Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed STI for wide transistors
- Patent number 8,058,161
- Issue date Nov 15, 2011
- Texas Instruments Incorporated
- Gabriel George Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Degradation correction for finFET circuits
- Patent number 8,049,214
- Issue date Nov 1, 2011
- Texas Instruments Incorporated
- Andrew Marshall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature dependent back-bias for a memory array
- Patent number 8,018,780
- Issue date Sep 13, 2011
- Texas Instruments Incorporated
- Theodore W. Houston
- G11 - INFORMATION STORAGE
Information Patent Grant
Body bias coordinator, method of coordinating a body bias and sub-c...
- Patent number 7,978,004
- Issue date Jul 12, 2011
- Texas Instruments Incorporated
- Theodore W. Houston
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MAGNETOELECTRIC XNOR LOGIC GATE DEVICE
- Publication number 20220294448
- Publication date Sep 15, 2022
- Board of Regents of the University of Nebraska
- Nishtha Sharma GAUL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETOELECTRIC MAJORITY GATE DEVICE
- Publication number 20220294449
- Publication date Sep 15, 2022
- Board of Regents of the University of Nebraska
- Nishtha Sharma GAUL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETOELECTRIC INVERTER
- Publication number 20220294450
- Publication date Sep 15, 2022
- Board of Regents of the University of Nebraska
- Nishtha Sharma GAUL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM MOLECULAR MEMORY
- Publication number 20220238537
- Publication date Jul 28, 2022
- Board of Regents of the University of Nebraska
- Peter A. Dowben
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUITS BASED ON MAGNETOELECTRIC TRANSISTOR DEVICES
- Publication number 20200099379
- Publication date Mar 26, 2020
- Board of Regents of the University of Nebraska
- Nishtha SHARMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Unipolar Magnetoelectric Magnetic Tunnel Junction
- Publication number 20180212141
- Publication date Jul 26, 2018
- Board of Regents, The University of Texas System
- Nishtha Sharma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mismatch Correction in Differential Amplifiers Using Analog Floatin...
- Publication number 20170149395
- Publication date May 25, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ujas Natvarlal Patel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONFIGURABLE EXCLUSIVE-OR / EXCLUSIVE-NOR GATE USING MAGNETO-ELECTR...
- Publication number 20170093398
- Publication date Mar 30, 2017
- The Research Foundation for The State University of New York
- Jonathan P. Bird
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO MATCH SOI TRANSISTORS USING A LOCAL HEATER ELEMENT
- Publication number 20160141304
- Publication date May 19, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR COMBINATION STRESS TESTING
- Publication number 20160061877
- Publication date Mar 3, 2016
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT ALLOWING PRECISION ANALYSIS OF DELTA PERFORMANCE DEGRA...
- Publication number 20130063170
- Publication date Mar 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Andrew MARSHALL
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY DOUBLER/INVERTER
- Publication number 20120146690
- Publication date Jun 14, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIFFERENTIAL INPUT FOR AMBIPOLAR DEVICES
- Publication number 20120112822
- Publication date May 10, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD TO MATCH SOI TRANSISTORS USING A LOCAL HEATER ELEMENT
- Publication number 20120112823
- Publication date May 10, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G05 - CONTROLLING REGULATING
Information Patent Application
CURRENT MIRROR USING AMBIPOLAR DEVICES
- Publication number 20120105046
- Publication date May 3, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G05 - CONTROLLING REGULATING
Information Patent Application
Precision Measurement of Capacitor Mismatch
- Publication number 20120019263
- Publication date Jan 26, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
BODY BIAS COORDINATOR, METHOD OF COORDINATING A BODY BIAS AND SUB-C...
- Publication number 20110221515
- Publication date Sep 15, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Theodore W. Houston
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUITS WITH SPLIT GATE AND COMMON GATE FinFET TRANSISTORS
- Publication number 20110134684
- Publication date Jun 9, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT ALLOWING PRECISION ANALYSIS OF DELTA PERFORMANCE DEGRA...
- Publication number 20110050247
- Publication date Mar 3, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Andrew MARSHALL
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE RESPONSIVE BACK BIAS CONTROL FOR INTEGRATED CIRCUIT
- Publication number 20110043255
- Publication date Feb 24, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Theodore W. Houston
- G05 - CONTROLLING REGULATING
Information Patent Application
IN LINE TEST CIRCUIT AND METHOD FOR DETERMINING INTERCONNNECT ELECT...
- Publication number 20100297793
- Publication date Nov 25, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Makarand R. Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Increasing the Extent of Built-In Self-Testin...
- Publication number 20100229056
- Publication date Sep 9, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF...
- Publication number 20100164533
- Publication date Jul 1, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE STRESS TECHNIQUE FOR RELIABILITY DEGRADATION MEASUREMENT
- Publication number 20100164531
- Publication date Jul 1, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING CARBON NANOTUBE TRANSISTORS ON A SILICON OR...
- Publication number 20100133512
- Publication date Jun 3, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Ashesh Parikh
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROCESS FOR FORMING BOTH SPLIT GATE AND COMMON GATE FINFET TRANSIST...
- Publication number 20100118599
- Publication date May 13, 2010
- Texas Instruments Inc.
- Andrew Marshall
- G11 - INFORMATION STORAGE
Information Patent Application
SOI MUGFETS HAVING SINGLE GATE ELECTRODE LEVEL
- Publication number 20100052025
- Publication date Mar 4, 2010
- Texas Instruments Inc.
- Howard Lee Tigelaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING CARBON NANOTUBE TRANSISTORS ON A SILICON OR...
- Publication number 20100038627
- Publication date Feb 18, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Ashesh Parikh
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEGRADATION CORRECTION FOR FINFET CIRCUITS
- Publication number 20100032671
- Publication date Feb 11, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Memory Device with Memory Cell Including MuGFET and FIN Capacitor
- Publication number 20100002494
- Publication date Jan 7, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Weize Xiong
- H01 - BASIC ELECTRIC ELEMENTS

Andrew Marshall

Person

Patents Grantslast 30 patents

Thin film molecular memory

Magnetoelectric majority gate device

Magnetoelectric XNOR logic gate device

Magnetoelectric inverter

Circuits based on magnetoelectric transistor devices

Unipolar magnetoelectric magnetic tunnel junction

Mismatch correction in differential amplifiers using analog floatin...

Method to match SOI transistors using a local heater element

Configurable exclusive-OR / exclusive-NOR gate using magneto-electr...

Capacitor combination stress testing

Exclusive-OR gate using magneto-electric tunnel junctions

Non-volatile latch using magneto-electric and ferro-electric tunnel...

Majority- and minority-gate logic schemes based on magneto-electric...

Method to match SOI transistors using a local heater element

Body bias coordinator, method of coordinating a body bias and sub-c...

Test circuit allowing precision analysis of delta performance degra...

Wireless authorization mechanism for mobile devices and data thereon

Precision measurement of capacitor mismatch

SOI MuGFETs having single gate electrode level

Frequency doubler/inverter

Programmable circuit with carbon nanotube

Test circuit allowing precision analysis of delta performance degra...

Differential input for ambipolar devices

Temperature responsive back bias control for integrated circuit

Integrated circuits with split gate and common gate FinFET transistors

Memory device with memory cell including MuGFET and FIN capacitor

Recessed STI for wide transistors

Degradation correction for finFET circuits

Temperature dependent back-bias for a memory array

Body bias coordinator, method of coordinating a body bias and sub-c...

Patents Applicationslast 30 patents

MAGNETOELECTRIC XNOR LOGIC GATE DEVICE

MAGNETOELECTRIC MAJORITY GATE DEVICE

MAGNETOELECTRIC INVERTER

THIN FILM MOLECULAR MEMORY

CIRCUITS BASED ON MAGNETOELECTRIC TRANSISTOR DEVICES

Unipolar Magnetoelectric Magnetic Tunnel Junction

Mismatch Correction in Differential Amplifiers Using Analog Floatin...

CONFIGURABLE EXCLUSIVE-OR / EXCLUSIVE-NOR GATE USING MAGNETO-ELECTR...

METHOD TO MATCH SOI TRANSISTORS USING A LOCAL HEATER ELEMENT

CAPACITOR COMBINATION STRESS TESTING

TEST CIRCUIT ALLOWING PRECISION ANALYSIS OF DELTA PERFORMANCE DEGRA...

FREQUENCY DOUBLER/INVERTER

DIFFERENTIAL INPUT FOR AMBIPOLAR DEVICES

METHOD TO MATCH SOI TRANSISTORS USING A LOCAL HEATER ELEMENT

CURRENT MIRROR USING AMBIPOLAR DEVICES

Precision Measurement of Capacitor Mismatch

BODY BIAS COORDINATOR, METHOD OF COORDINATING A BODY BIAS AND SUB-C...

INTEGRATED CIRCUITS WITH SPLIT GATE AND COMMON GATE FinFET TRANSISTORS

TEST CIRCUIT ALLOWING PRECISION ANALYSIS OF DELTA PERFORMANCE DEGRA...

TEMPERATURE RESPONSIVE BACK BIAS CONTROL FOR INTEGRATED CIRCUIT

IN LINE TEST CIRCUIT AND METHOD FOR DETERMINING INTERCONNNECT ELECT...

System and Method for Increasing the Extent of Built-In Self-Testin...

METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF...

TUNABLE STRESS TECHNIQUE FOR RELIABILITY DEGRADATION MEASUREMENT

METHOD FOR FABRICATING CARBON NANOTUBE TRANSISTORS ON A SILICON OR...

PROCESS FOR FORMING BOTH SPLIT GATE AND COMMON GATE FINFET TRANSIST...

SOI MUGFETS HAVING SINGLE GATE ELECTRODE LEVEL

METHOD FOR FABRICATING CARBON NANOTUBE TRANSISTORS ON A SILICON OR...

DEGRADATION CORRECTION FOR FINFET CIRCUITS

Memory Device with Memory Cell Including MuGFET and FIN Capacitor