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Andrew Michael Patzwald
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Kirkland, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for operating a coordinate measuring machine
Patent number
10,215,547
Issue date
Feb 26, 2019
Mitutoyo Corporation
Scott Ellis Hemmings
G01 - MEASURING TESTING
Information
Patent Grant
Method for operating a coordinate measuring machine
Patent number
9,970,744
Issue date
May 15, 2018
Mitutoyo Corporation
Scott Ellis Hemmings
G01 - MEASURING TESTING
Information
Patent Grant
Chromatic range sensor including dynamic intensity compensation fun...
Patent number
9,958,266
Issue date
May 1, 2018
Mitutoyo Corporation
Andrew Michael Patzwald
G02 - OPTICS
Information
Patent Grant
Position encoder sample timing system
Patent number
9,877,042
Issue date
Jan 23, 2018
Mitutoyo Corporation
Bjorn Erik Bertil Jansson
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Chromatic range sensor including high sensitivity measurement mode
Patent number
9,261,351
Issue date
Feb 16, 2016
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Grant
Interchangeable chromatic range sensor probe for a coordinate measu...
Patent number
9,115,982
Issue date
Aug 25, 2015
Mitutoyo Corporation
Benjamin Keith Jones
G01 - MEASURING TESTING
Information
Patent Grant
Method for identifying abnormal spectral profiles measured by a chr...
Patent number
8,928,874
Issue date
Jan 6, 2015
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Grant
Chromatic range sensor including measurement reliability characteri...
Patent number
8,860,931
Issue date
Oct 14, 2014
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Grant
Interchangeable optics configuration for a chromatic range sensor o...
Patent number
8,817,240
Issue date
Aug 26, 2014
Mitutoyo Corporation
Benjamin Keith Jones
G01 - MEASURING TESTING
Information
Patent Grant
Interchangeable chromatic range sensor probe for a coordinate measu...
Patent number
8,736,817
Issue date
May 27, 2014
Mitutoyo Corporation
Benjamin Keith Jones
G01 - MEASURING TESTING
Information
Patent Grant
Displacement transducer with selectable detector area
Patent number
7,515,280
Issue date
Apr 7, 2009
Mitutoyo Corporation
Casey Edward Emtman
G01 - MEASURING TESTING
Information
Patent Grant
Operator interface apparatus and method for displacement transducer...
Patent number
7,400,415
Issue date
Jul 15, 2008
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Grant
Scale structures and methods usable in an absolute position transducer
Patent number
6,867,412
Issue date
Mar 15, 2005
Mitutoyo Corporation
Andrew M. Patzwald
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR OPERATING A COORDINATE MEASURING MACHINE
Publication number
20170370688
Publication date
Dec 28, 2017
MITUTOYO CORPORATION
Scott Ellis Hemmings
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OPERATING A COORDINATE MEASURING MACHINE
Publication number
20170370689
Publication date
Dec 28, 2017
MITUTOYO CORPORATION
Scott Ellis Hemmings
G01 - MEASURING TESTING
Information
Patent Application
CHROMATIC RANGE SENSOR INCLUDING DYNAMIC INTENSITY COMPENSATION FUN...
Publication number
20170010452
Publication date
Jan 12, 2017
MITUTOYO CORPORATION
Andrew Michael Patzwald
G02 - OPTICS
Information
Patent Application
Interchangeable Chromatic Range Sensor Probe for a Coordinate Measu...
Publication number
20140340679
Publication date
Nov 20, 2014
Mitutoyo Corporation
Benjamin Keith Jones
G01 - MEASURING TESTING
Information
Patent Application
INTERCHANGEABLE CHROMATIC RANGE SENSOR PROBE FOR A COORDINATE MEASU...
Publication number
20130314689
Publication date
Nov 28, 2013
Benjamin Keith Jones
G01 - MEASURING TESTING
Information
Patent Application
INTERCHANGEABLE OPTICS CONFIGURATION FOR A CHROMATIC RANGE SENSOR O...
Publication number
20130314690
Publication date
Nov 28, 2013
Mitutoyo Corporation
Benjamin Keith Jones
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFYING ABNORMAL SPECTRAL PROFILES MEASURED BY A CHR...
Publication number
20130222797
Publication date
Aug 29, 2013
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Application
CHROMATIC RANGE SENSOR INCLUDING MEASUREMENT RELIABILITY CHARACTERI...
Publication number
20130222815
Publication date
Aug 29, 2013
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Application
Displacement transducer with selectable detector area
Publication number
20070146729
Publication date
Jun 28, 2007
MITUTOYO CORPORATION
Casey Edward Emtman
G01 - MEASURING TESTING
Information
Patent Application
Operator interface apparatus and method for displacement transducer...
Publication number
20060229744
Publication date
Oct 12, 2006
Mitutoyo Corporation
Andrew Michael Patzwald
G01 - MEASURING TESTING
Information
Patent Application
Scale structures and methods usable in an absolute position transducer
Publication number
20040089796
Publication date
May 13, 2004
Mitutoyo Corporation
Andrew M. Patzwald
G01 - MEASURING TESTING