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Andrew N. Erickson
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Scanned probe mounting design
Patent number
10,816,571
Issue date
Oct 27, 2020
Angstrom Science, Inc.
Andrew Norman Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Fiber optic displacement sensor
Patent number
10,260,914
Issue date
Apr 16, 2019
Angstrom Science, Inc.
Stephen Bradley Ippolito
G02 - OPTICS
Information
Patent Grant
Method for imaging a feature using a scanning probe microscope
Patent number
9,869,696
Issue date
Jan 16, 2018
FEI EFA, INC.
Andrew Norman Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope head design
Patent number
9,797,922
Issue date
Oct 24, 2017
Angstrom Science, Inc.
Andrew Norman Erickson
G02 - OPTICS
Information
Patent Grant
Apparatus and method for combined micro-scale and nano-scale C-V, Q...
Patent number
9,551,743
Issue date
Jan 24, 2017
DCG Systems, Inc.
Andrew N. Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope head design
Patent number
9,366,695
Issue date
Jun 14, 2016
Angstrom Science, Inc.
Andrew Norman Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer isolated transfer chuck
Patent number
8,800,998
Issue date
Aug 12, 2014
Multiprobe, Inc.
Andrew N. Erickson
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Software synchronization of multiple scanning probes
Patent number
7,444,857
Issue date
Nov 4, 2008
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Grant
Deconvolving tip artifacts using multiple scanning probes
Patent number
7,415,868
Issue date
Aug 26, 2008
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Grant
Software synchronization of multiple scanning probes
Patent number
6,951,130
Issue date
Oct 4, 2005
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for high resolution profiling in semiconductor...
Patent number
6,287,880
Issue date
Sep 11, 2001
Veeco Instruments Inc.
Andrew Norman Erickson
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Temperature sensing probe for microthermometry
Patent number
5,713,667
Issue date
Feb 3, 1998
Advanced Micro Devices, Inc.
Roger Alvis
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning spreading resistance probe
Patent number
5,710,052
Issue date
Jan 20, 1998
Advanced Micro Devices, Inc.
Roger L. Alvis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SCANNED PROBE MOUNTING DESIGN
Publication number
20200363450
Publication date
Nov 19, 2020
Andrew Norman Erickson
G01 - MEASURING TESTING
Information
Patent Application
ORTHOGONAL TWO AXIS KINEMATIC TRANSLATION STAGE
Publication number
20200240576
Publication date
Jul 30, 2020
Andrew Norman Erickson
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
DIAMOND DELAYERING FOR ELECTRICAL PROBING
Publication number
20170003336
Publication date
Jan 5, 2017
DCG SYSTEMS, INC.
Stephen Ippolito
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMAGING A FEATURE USING A SCANNING PROBE MICROSCOPE
Publication number
20160231353
Publication date
Aug 11, 2016
DCG SYSTEMS, INC.
Andrew Norman Erickson
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
Publication number
20160216314
Publication date
Jul 28, 2016
MULTIPROBE, INC.
Andrew N. Erickson
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE HEAD DESIGN
Publication number
20160202288
Publication date
Jul 14, 2016
Angstrom Science, Inc.
Andrew Norman Erickson
G02 - OPTICS
Information
Patent Application
SCANNING PROBE MICROSCOPE HEAD DESIGN
Publication number
20160025771
Publication date
Jan 28, 2016
Angstrom Science, Inc.
Andrew Norman Erickson
G02 - OPTICS
Information
Patent Application
APPARATUS AND METHOD FOR ATOMIC FORCE, NEAR-FIELD SCANNING OPTICAL...
Publication number
20150338627
Publication date
Nov 26, 2015
MULTIPROBE, INC.
Andrew Norman Erickson
G02 - OPTICS
Information
Patent Application
SEMICONDUCTOR WAFER ISOLATED TRANSFER CHUCK
Publication number
20130168929
Publication date
Jul 4, 2013
MULTIPROBE, INC.
Andrew N. Erickson
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
Publication number
20120146669
Publication date
Jun 14, 2012
MULTIPROBE, INC.
Andrew N. Erickson
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
Publication number
20100148813
Publication date
Jun 17, 2010
MULTIPROBE, INC.
Andrew N. Erickson
G01 - MEASURING TESTING
Information
Patent Application
Deconvolving tip artifacts using multiple scanning probes
Publication number
20070084273
Publication date
Apr 19, 2007
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Application
Software synchronization of multiple scanning probes
Publication number
20060032296
Publication date
Feb 16, 2006
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Application
Software synchronization of multiple scanning probes
Publication number
20050097944
Publication date
May 12, 2005
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Application
Software synchronization of multiple scanning probes
Publication number
20040025578
Publication date
Feb 12, 2004
Casey Patrick Hare
G01 - MEASURING TESTING