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Andrew Nathan Mort
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Tewksbury, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Comparator with configurable operating modes
Patent number
12,191,864
Issue date
Jan 7, 2025
Analog Devices, Inc.
Christopher C. McQuilkin
G01 - MEASURING TESTING
Information
Patent Grant
Path loss compensation for comparator
Patent number
11,686,773
Issue date
Jun 27, 2023
Analog Devices, Inc.
Christopher C. McQuilkin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Comparator with configurable operating modes
Patent number
11,637,551
Issue date
Apr 25, 2023
Analog Devices, Inc.
Christopher C. McQuilkin
G11 - INFORMATION STORAGE
Information
Patent Grant
Deskew cell for delay and pulse width adjustment
Patent number
11,456,729
Issue date
Sep 27, 2022
Analog Devices, Inc.
Andrew Nathan Mort
G01 - MEASURING TESTING
Information
Patent Grant
Comparator with configurable operating modes
Patent number
11,128,287
Issue date
Sep 21, 2021
Analog Devices, Inc.
Christopher C. McQuilkin
G01 - MEASURING TESTING
Information
Patent Grant
Deskew circuit for automated test systems
Patent number
10,547,294
Issue date
Jan 28, 2020
Analog Devices, Inc.
Andrew Nathan Mort
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
COMPARATOR WITH CONFIGURABLE OPERATING MODES
Publication number
20230231547
Publication date
Jul 20, 2023
Analog Devices, Inc.
Christopher C. McQuilkin
G11 - INFORMATION STORAGE
Information
Patent Application
DESKEW CELL FOR DELAY AND PULSE WIDTH ADJUSTMENT
Publication number
20220311426
Publication date
Sep 29, 2022
Analog Devices, Inc.
Andrew Nathan Mort
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
COMPARATOR WITH CONFIGURABLE OPERATING MODES
Publication number
20210391854
Publication date
Dec 16, 2021
Analog Devices, Inc.
Christopher C. McQuilkin
G11 - INFORMATION STORAGE
Information
Patent Application
COMPARATOR WITH CONFIGURABLE OPERATING MODES
Publication number
20210297069
Publication date
Sep 23, 2021
Analog Devices, Inc.
Christopher C. McQuilkin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DESKEW CIRCUIT FOR AUTOMATED TEST SYSTEMS
Publication number
20180358957
Publication date
Dec 13, 2018
Analog Devices, Inc.
Andrew Nathan Mort
G01 - MEASURING TESTING