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Andrew Neushul
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Goleta, CA, US
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last 30 patents
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Patent Grant
Low drift system for a metrology instrument
Patent number
10,900,997
Issue date
Jan 26, 2021
Bruker Nano, Inc.
Andrew Neushul
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Low Drift System for a Metrology Instrument
Publication number
20200166540
Publication date
May 28, 2020
Bruker Nano, Inc.
Andrew Neushul
G01 - MEASURING TESTING
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Patent Application
TIME-DEPENDENT NAVIGATION OF TELEPRESENCE ROBOTS
Publication number
20130325244
Publication date
Dec 5, 2013
Yulun Wang
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS