Andrew S. Hildebrant

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cost estimation for device testing
- Patent number 8,769,361
- Issue date Jul 1, 2014
- Advantest (Singapore) Pte Ltd
- Andrew S. Hildebrant
- G11 - INFORMATION STORAGE
Information Patent Grant
Source synchronous timing extraction, cyclization and sampling
- Patent number 8,010,933
- Issue date Aug 30, 2011
- Verigy (Singapore) Pte. Ltd.
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for adaptively compressing test data
- Patent number 7,404,109
- Issue date Jul 22, 2008
- Verigy (Singapore) Pte. Ltd.
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Wireless no-touch testing of integrated circuits
- Patent number 7,181,663
- Issue date Feb 20, 2007
- Verigy Pte, Ltd.
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing a device-under-test
- Patent number 7,146,539
- Issue date Dec 5, 2006
- Verigy IPco
- Andrew S. Hildebrant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Verification of integrated circuit tests using test simulation and...
- Patent number 7,137,083
- Issue date Nov 14, 2006
- Verigy IPco
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Source synchronous timing extraction, cyclization and sampling
- Patent number 7,100,132
- Issue date Aug 29, 2006
- Agilent Technologies, Inc.
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing performance of an electronic device
- Patent number 7,100,098
- Issue date Aug 29, 2006
- Agilent Technologies, Inc.
- Andrew Steven Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for optimizing lists of waveforms
- Patent number 7,010,453
- Issue date Mar 7, 2006
- Agilent Technologies, Inc.
- Andrew Steven Hildebrant
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for optimizing the masking of waveforms to re...
- Patent number 6,944,558
- Issue date Sep 13, 2005
- Agilent Technologies, Inc.
- Andrew Steven Hildebrant
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Source synchronous timing extraction, cyclization and sampling
- Publication number 20060253812
- Publication date Nov 9, 2006
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
Verification of integrated circuit tests using test simulation and...
- Publication number 20050229121
- Publication date Oct 13, 2005
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
Source synchronous timing extraction, cyclization and sampling
- Publication number 20050193355
- Publication date Sep 1, 2005
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
Wireless no-touch testing of integrated circuits
- Publication number 20050193294
- Publication date Sep 1, 2005
- Andrew S. Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR OPTIMIZING THE MASKING OF WAVEFORMS TO RE...
- Publication number 20050080573
- Publication date Apr 14, 2005
- Andrew Steven Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for optimizing lists of waveforms
- Publication number 20050080575
- Publication date Apr 14, 2005
- Andrew Steven Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
Cost estimation for device testing
- Publication number 20050074735
- Publication date Apr 7, 2005
- Andrew S. Hildebrant
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Systems and methods for testing a device-under-test
- Publication number 20050039099
- Publication date Feb 17, 2005
- Andrew S. Hildebrant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and methods for testing performance of an electronic device
- Publication number 20040255214
- Publication date Dec 16, 2004
- Andrew Steven Hildebrant
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for adaptively compressing test data
- Publication number 20040255215
- Publication date Dec 16, 2004
- Andrew S. Hildebrant
- G01 - MEASURING TESTING

Andrew S. Hildebrant

Person

Patents Grantslast 30 patents

Cost estimation for device testing

Source synchronous timing extraction, cyclization and sampling

Systems and methods for adaptively compressing test data

Wireless no-touch testing of integrated circuits

Systems and methods for testing a device-under-test

Verification of integrated circuit tests using test simulation and...

Source synchronous timing extraction, cyclization and sampling

Systems and methods for testing performance of an electronic device

Methods and apparatus for optimizing lists of waveforms

Methods and apparatus for optimizing the masking of waveforms to re...

Patents Applicationslast 30 patents

Source synchronous timing extraction, cyclization and sampling

Verification of integrated circuit tests using test simulation and...

Source synchronous timing extraction, cyclization and sampling

Wireless no-touch testing of integrated circuits

METHODS AND APPARATUS FOR OPTIMIZING THE MASKING OF WAVEFORMS TO RE...

Methods and apparatus for optimizing lists of waveforms

Cost estimation for device testing

Systems and methods for testing a device-under-test

Systems and methods for testing performance of an electronic device

Systems and methods for adaptively compressing test data