Andrew W. Kulawiec

Person

Fairport, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated wavefront sensor and profilometer
- Patent number 9,097,612
- Issue date Aug 4, 2015
- QED Technologies International, Inc.
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Feature isolation for frequency-shifting interferometry
- Patent number 7,286,238
- Issue date Oct 23, 2007
- Corning Incorporated
- Christopher A. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Phase-resolved measurement for frequency-shifting interferometry
- Patent number 7,268,889
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Overlapping common-path interferometers for two-sided measurement
- Patent number 7,268,887
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Optical feedback from mode-selective tuner
- Patent number 7,259,860
- Issue date Aug 21, 2007
- Corning Incorporated
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
Mode-selective frequency tuning system
- Patent number 7,209,499
- Issue date Apr 24, 2007
- Corning Incorporated
- Nestor Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-wavelength confocal interferometer for measuring multiple surfaces
- Patent number 6,781,699
- Issue date Aug 24, 2004
- Corning-Tropel
- Thomas J. Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Fringe pattern discriminator for grazing incidence interferometer
- Patent number 6,757,067
- Issue date Jun 29, 2004
- Corning Incorporated
- Christopher A. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Moiré interferometer with overlapping illumination and imag...
- Patent number 6,456,384
- Issue date Sep 24, 2002
- Tropel Corporation
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence interferometry for measuring transparent plane-pa...
- Patent number 5,923,425
- Issue date Jul 13, 1999
- Tropel Corporation
- Paul G. Dewa
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for measuring thickness variations of semiconductor...
- Patent number 5,909,282
- Issue date Jun 1, 1999
- Tropel Corporation
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with compound optics for measuring cylindrical objec...
- Patent number 5,793,488
- Issue date Aug 11, 1998
- Tropel Corporation
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of absolute dimensions of cylindrical s...
- Patent number 5,777,738
- Issue date Jul 7, 1998
- Tropel Corporation
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction management for grazing incidence interferometer
- Patent number 5,719,676
- Issue date Feb 17, 1998
- Tropel Corporation
- Andrew W. Kulawiec
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED WAVEFRONT SENSOR AND PROFILOMETER
- Publication number 20140152999
- Publication date Jun 5, 2014
- Andrew KULAWIEC
- G01 - MEASURING TESTING
Information Patent Application
Overlapping common-path interferometers for two-sided measurement
- Publication number 20060139656
- Publication date Jun 29, 2006
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Application
Optical feedback from mode-selective tuner
- Publication number 20060062260
- Publication date Mar 23, 2006
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
Mode-selective frequency tuning system
- Publication number 20060062261
- Publication date Mar 23, 2006
- Nestor Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase-resolved measurement for frequency-shifting interferometry
- Publication number 20060061772
- Publication date Mar 23, 2006
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Application
Feature isolation for frequency-shifting interferometry
- Publication number 20060061773
- Publication date Mar 23, 2006
- Christopher A. Lee
- G01 - MEASURING TESTING
Information Patent Application
Two-wavelength confocal interferometer for measuring multiple surfaces
- Publication number 20040075842
- Publication date Apr 22, 2004
- Thomas J. Dunn
- G01 - MEASURING TESTING
Information Patent Application
FRINGE PATTERN DISCRIMINATOR FOR GRAZING INCIDENCE INTERFEROMETER
- Publication number 20040027579
- Publication date Feb 12, 2004
- Christopher A. Lee
- G01 - MEASURING TESTING

Andrew W. Kulawiec

Person

Patents Grantslast 30 patents

Integrated wavefront sensor and profilometer

Feature isolation for frequency-shifting interferometry

Phase-resolved measurement for frequency-shifting interferometry

Overlapping common-path interferometers for two-sided measurement

Optical feedback from mode-selective tuner

Mode-selective frequency tuning system

Two-wavelength confocal interferometer for measuring multiple surfaces

Fringe pattern discriminator for grazing incidence interferometer

Moir&#x000E9; interferometer with overlapping illumination and imag...

Grazing incidence interferometry for measuring transparent plane-pa...

Interferometer for measuring thickness variations of semiconductor...

Interferometer with compound optics for measuring cylindrical objec...

Interferometric measurement of absolute dimensions of cylindrical s...

Diffraction management for grazing incidence interferometer

Patents Applicationslast 30 patents

INTEGRATED WAVEFRONT SENSOR AND PROFILOMETER

Overlapping common-path interferometers for two-sided measurement

Optical feedback from mode-selective tuner

Mode-selective frequency tuning system

Phase-resolved measurement for frequency-shifting interferometry

Feature isolation for frequency-shifting interferometry

Two-wavelength confocal interferometer for measuring multiple surfaces

FRINGE PATTERN DISCRIMINATOR FOR GRAZING INCIDENCE INTERFEROMETER

Moiré interferometer with overlapping illumination and imag...