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Andrew Weeks Kueny
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Carrollton, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
System, apparatus, and method for improved background correction an...
Patent number
12,174,071
Issue date
Dec 24, 2024
Verity Instruments, Inc.
John Corless
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measurement of complex structures
Patent number
10,861,755
Issue date
Dec 8, 2020
Verity Instruments, Inc.
Andrew Weeks Kueny
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for calibration of optical signals in semiconduct...
Patent number
10,365,212
Issue date
Jul 30, 2019
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam exciter for use in chemical analysis in processing sy...
Patent number
9,997,325
Issue date
Jun 12, 2018
Verity Instruments, Inc.
Jimmy W. Hosch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Referenced and stabilized optical measurement system
Patent number
9,772,226
Issue date
Sep 26, 2017
Verity Instruments, Inc.
John Douglas Corless
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for enhancing dynamic range of charge coupled...
Patent number
9,386,241
Issue date
Jul 5, 2016
Verity Instruments, Inc.
Andrew Weeks Kueny
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Workpiece characterization system
Patent number
9,383,323
Issue date
Jul 5, 2016
Verity Instruments, Inc.
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of a radiometric optical monitoring system used for fau...
Patent number
8,125,633
Issue date
Feb 28, 2012
Verity Instruments, Inc.
Mike Whelan
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne reflectometer for film thickness monitoring and method f...
Patent number
7,339,682
Issue date
Mar 4, 2008
Verity Instruments, Inc.
Arun Ananth Aiyer
G01 - MEASURING TESTING
Information
Patent Grant
System and method for in-situ monitor and control of film thickness...
Patent number
7,049,156
Issue date
May 23, 2006
Verity Instruments, Inc.
Andrew Weeks Kueny
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical closed-loop control system for a CMP apparatus and method o...
Patent number
6,991,514
Issue date
Jan 31, 2006
Verity Instruments, Inc.
Mark A. Meloni
B24 - GRINDING POLISHING
Information
Patent Grant
Apparatus for characterization of microelectronic feature quality
Patent number
6,642,063
Issue date
Nov 4, 2003
Lam Research Corporation
Randall S. Mundt
G01 - MEASURING TESTING
Information
Patent Grant
Method for characterization of microelectronic feature quality
Patent number
6,432,729
Issue date
Aug 13, 2002
Lam Research Corporation
Randall S. Mundt
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic ellipsometer
Patent number
6,052,188
Issue date
Apr 18, 2000
Verity Instruments, Inc.
David U. Fluckiger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...
Publication number
20240019302
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR FAULT DETECTION AND OPERATIONAL READINESS FOR...
Publication number
20240019305
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, APPARATUS, AND METHOD FOR IMPROVED BACKGROUND CORRECTION AN...
Publication number
20230366736
Publication date
Nov 16, 2023
Verity Instruments, Inc.
John Corless
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASUREMENT OF COMPLEX STRUCTURES
Publication number
20180226305
Publication date
Aug 9, 2018
Verity Instruments, Inc.
Andrew Weeks Kueny
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATION OF OPTICAL SIGNALS IN SEMICONDUCT...
Publication number
20180136118
Publication date
May 17, 2018
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Monitoring Pulsed Plasma Processes
Publication number
20160131587
Publication date
May 12, 2016
Verity Instruments, Inc.
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Measuring Process Parameters of a Plasma E...
Publication number
20130016344
Publication date
Jan 17, 2013
Larry Bullock
G01 - MEASURING TESTING
Information
Patent Application
REFERENCED AND STABILIZED OPTICAL MEASUREMENT SYSTEM
Publication number
20130016343
Publication date
Jan 17, 2013
John Douglas Corless
G01 - MEASURING TESTING
Information
Patent Application
Workpiece Characterization System
Publication number
20120120387
Publication date
May 17, 2012
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Application
Workpiece Characterization System
Publication number
20120025097
Publication date
Feb 2, 2012
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Application
Electron beam exciter for use in chemical analysis in processing sy...
Publication number
20100032587
Publication date
Feb 11, 2010
Jimmy W. Hosch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Calibration of a radiometric optical monitoring system used for fau...
Publication number
20090103081
Publication date
Apr 23, 2009
Verity Instruments, Inc.
Mike Whelan
G01 - MEASURING TESTING
Information
Patent Application
Heterodyne reflectomer for film thickness monitoring and method for...
Publication number
20060192973
Publication date
Aug 31, 2006
Verity Instruments, Inc.
Arun Ananth Aiyer
G01 - MEASURING TESTING
Information
Patent Application
Plasma treatment apparatus and light detection method of a plasma t...
Publication number
20060012796
Publication date
Jan 19, 2006
Susumu Saito
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhancing dynamic range of charge coupled...
Publication number
20050001914
Publication date
Jan 6, 2005
Andrew Weeks Kueny
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND METHOD FOR IN-SITU MONITOR AND CONTROL OF FILM THICKNESS...
Publication number
20040185582
Publication date
Sep 23, 2004
Andrew Weeks Kueny
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus for characterization of microelectronic feature quality
Publication number
20030020917
Publication date
Jan 30, 2003
Randall S. Mundt
G01 - MEASURING TESTING