Andrey N. Vilkov

Person

Aliso Viejo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for trace detection of low volatile substances
- Patent number 12,181,394
- Issue date Dec 31, 2024
- Analytical Detection LLC
- Andrey N Vilkov
- G01 - MEASURING TESTING
Information Patent Grant
Liquid phase ion mobility spectrometer
- Patent number 11,029,282
- Issue date Jun 8, 2021
- Analytical Detection LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Grant
Temperature influenced chemical vaporization and detection of compo...
- Patent number 10,345,282
- Issue date Jul 9, 2019
- Rapiscan Systems, Inc.
- Andrey N. Vilkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical vaporization and detection of compounds having low volatility
- Patent number 10,317,387
- Issue date Jun 11, 2019
- Rapiscan Systems, Inc.
- Andrey N. Vilkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for trace detection using dual ionization sources
- Patent number 9,952,179
- Issue date Apr 24, 2018
- Rapiscan Systems, Inc.
- Andrey N. Vilkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective ion chemistry for nitrate detection
- Patent number 9,726,655
- Issue date Aug 8, 2017
- Morpho Detection, LLC
- Jack A. Syage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature influenced chemical vaporization and detection of compo...
- Patent number 9,689,857
- Issue date Jun 27, 2017
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Grant
Chemical vaporization and detection of compounds having low volatility
- Patent number 9,683,981
- Issue date Jun 20, 2017
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Grant
System and method for using additives with isotopic patterns to enh...
- Patent number 9,482,655
- Issue date Nov 1, 2016
- Morpho Detection, LLC
- Andrey N. Vilkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoemission induced electron ionization
- Patent number 8,288,735
- Issue date Oct 16, 2012
- Morpho Detection, Inc.
- Jack A. Syage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion fragmentation in mass spectrometry
- Patent number 8,188,423
- Issue date May 29, 2012
- Science & Engineering Services, Inc.
- Vladimir M. Doroshenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion fragmentation in mass spectrometry
- Patent number 7,723,676
- Issue date May 25, 2010
- Science & Engineering Services, Inc.
- Andrey Vilkov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR TRACE DETECTION OF LOW VOLATILE SUBSTANCES
- Publication number 20230069942
- Publication date Mar 9, 2023
- Analytical Detection LLC
- Andrey N Vilkov
- G01 - MEASURING TESTING
Information Patent Application
Temperature Influenced Chemical Vaporization and Detection of Compo...
- Publication number 20200158711
- Publication date May 21, 2020
- Rapiscan Systems, Inc.
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
LIQUID PHASE ION MOBILITY SPECTROMETER
- Publication number 20200064308
- Publication date Feb 27, 2020
- Analytical Detection LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
Chemical Vaporization and Detection of Compounds Having Low Volatility
- Publication number 20190271679
- Publication date Sep 5, 2019
- Rapiscan Systems, Inc.
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TRACE DETECTION USING DUAL IONIZATION SOURCES
- Publication number 20180284066
- Publication date Oct 4, 2018
- Rapiscan Systems, Inc.
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TRACE CHEMICAL DETECTION USING DUAL PHOTOIO...
- Publication number 20170309463
- Publication date Oct 26, 2017
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE INFLUENCED CHEMICAL VAPORIZATION AND DETECTION OF COMPO...
- Publication number 20170261483
- Publication date Sep 14, 2017
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL VAPORIZATION AND DETECTION OF COMPOUNDS HAVING LOW VOLATILITY
- Publication number 20170261484
- Publication date Sep 14, 2017
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF COMPOUNDS THROUGH DOPANT-ASSISTED PHOTOIONIZATION
- Publication number 20170213715
- Publication date Jul 27, 2017
- Morpho Detection, LLC
- Stephen Davila
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TRACE DETECTION USING DUAL IONIZATION SOURCES
- Publication number 20170191962
- Publication date Jul 6, 2017
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE ION CHEMISTRY FOR NITRATE DETECTION
- Publication number 20160282321
- Publication date Sep 29, 2016
- Morpho Detection, LLC
- Jack A. Syage
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TRACE DETECTION USING DUAL IONIZATION SOURCES
- Publication number 20160282304
- Publication date Sep 29, 2016
- Morpho Detection, LLC
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR USING ADDITIVES WITH ISOTOPIC PATTERNS TO ENH...
- Publication number 20150177214
- Publication date Jun 25, 2015
- MORPHO DETECTION, INC.
- Andrey N. Vilkov
- G01 - MEASURING TESTING
Information Patent Application
PHOTOEMISSION INDUCED ELECTRON IONIZATION
- Publication number 20110278447
- Publication date Nov 17, 2011
- Jack A. Syage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ION FRAGMENTATION IN MASS SPECTROMETRY
- Publication number 20100288920
- Publication date Nov 18, 2010
- Science & Engineering Services, Inc.
- Vladimir M. Doroshenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ION FRAGMENTATION IN MASS SPECTROMETRY
- Publication number 20090152458
- Publication date Jun 18, 2009
- Science & Engineering Services, Inc.
- Andrey Vilkov
- H01 - BASIC ELECTRIC ELEMENTS

Andrey N. Vilkov

Person

Patents Grantslast 30 patents

Method and system for trace detection of low volatile substances

Liquid phase ion mobility spectrometer

Temperature influenced chemical vaporization and detection of compo...

Chemical vaporization and detection of compounds having low volatility

System and method for trace detection using dual ionization sources

Selective ion chemistry for nitrate detection

Temperature influenced chemical vaporization and detection of compo...

Chemical vaporization and detection of compounds having low volatility

System and method for using additives with isotopic patterns to enh...

Photoemission induced electron ionization

Method and apparatus for ion fragmentation in mass spectrometry

Method and apparatus for ion fragmentation in mass spectrometry

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR TRACE DETECTION OF LOW VOLATILE SUBSTANCES

Temperature Influenced Chemical Vaporization and Detection of Compo...

LIQUID PHASE ION MOBILITY SPECTROMETER

Chemical Vaporization and Detection of Compounds Having Low Volatility

SYSTEM AND METHOD FOR TRACE DETECTION USING DUAL IONIZATION SOURCES

SYSTEMS AND METHODS FOR TRACE CHEMICAL DETECTION USING DUAL PHOTOIO...

TEMPERATURE INFLUENCED CHEMICAL VAPORIZATION AND DETECTION OF COMPO...

CHEMICAL VAPORIZATION AND DETECTION OF COMPOUNDS HAVING LOW VOLATILITY

DETECTION OF COMPOUNDS THROUGH DOPANT-ASSISTED PHOTOIONIZATION

SYSTEM AND METHOD FOR TRACE DETECTION USING DUAL IONIZATION SOURCES

SELECTIVE ION CHEMISTRY FOR NITRATE DETECTION

SYSTEM AND METHOD FOR TRACE DETECTION USING DUAL IONIZATION SOURCES

SYSTEM AND METHOD FOR USING ADDITIVES WITH ISOTOPIC PATTERNS TO ENH...

PHOTOEMISSION INDUCED ELECTRON IONIZATION

METHOD AND APPARATUS FOR ION FRAGMENTATION IN MASS SPECTROMETRY

METHOD AND APPARATUS FOR ION FRAGMENTATION IN MASS SPECTROMETRY