Andreyev V. Yuri

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Moscow, RU

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring distance using low clock rate si...
- Patent number 7,518,546
- Issue date Apr 14, 2009
- Samsung Electronics Co., Ltd.
- Jae-hyon Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring distance using low clock rate si...
- Publication number 20060214840
- Publication date Sep 28, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Jae-hyon Kim
- G01 - MEASURING TESTING