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Andries P. Bruins
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Leek, NL
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last 30 patents
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Patent Grant
Chemical noise reduction for mass spectrometry
Patent number
8,030,610
Issue date
Oct 4, 2011
DH Technologies Development Pte. Ltd.
Xinghua Guo
G01 - MEASURING TESTING
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Patent Grant
Chemical noise reduction for mass spectrometry
Patent number
7,528,365
Issue date
May 5, 2009
Applera Corporation
Xinghua Guo
G01 - MEASURING TESTING
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Atmospheric pressure photoionization (APPI): a new ionization metho...
Patent number
6,534,765
Issue date
Mar 18, 2003
MDS Inc.
Damon B. Robb
H01 - BASIC ELECTRIC ELEMENTS
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Ion spray apparatus and method
Patent number
4,861,988
Issue date
Aug 29, 1989
Cornell Research Foundation, Inc.
John D. Henion
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Chemical Noise Reduction For Mass Spectrometry
Publication number
20090256073
Publication date
Oct 15, 2009
MDS Inc.
Xinghua Guo
G01 - MEASURING TESTING
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Patent Application
CHEMICAL NOISE REDUCTION FOR MASS SPECTROMETRY
Publication number
20070262253
Publication date
Nov 15, 2007
Xinghua Guo
G01 - MEASURING TESTING