Andrzej Buczkowski

Person

Bend, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical metrology system for spectral imaging of a sample
- Patent number 9,846,122
- Issue date Dec 19, 2017
- Nanometrics Incorporated
- Andrzej Buczkowski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical metrology system for spectral imaging of a sample
- Patent number 9,182,351
- Issue date Nov 10, 2015
- Nanometrics Incorporated
- Andrzej Buczkowski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Procedure for in-situ determination of thermal gradients at the cry...
- Patent number 8,673,075
- Issue date Mar 18, 2014
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Silicon filter for photoluminescence metrology
- Patent number 8,330,946
- Issue date Dec 11, 2012
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for in-situ determination of thermal gradients at the cry...
- Patent number 8,221,545
- Issue date Jul 17, 2012
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for determining a minority carrier diffusion length using su...
- Patent number 7,521,954
- Issue date Apr 21, 2009
- Sumco Corporation
- Benno Orschel
- G01 - MEASURING TESTING
Information Patent Grant
Differential wavelength photoluminescence for non-contact measuring...
- Patent number 7,446,321
- Issue date Nov 4, 2008
- Nanometrics Incorporated
- Nicolas Laurent
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20160290927
- Publication date Oct 6, 2016
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20160116411
- Publication date Apr 28, 2016
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20150146193
- Publication date May 28, 2015
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
PROCEDURE FOR IN-SITU DETERMINATION OF THERMAL GRADIENTS AT THE CRY...
- Publication number 20120186512
- Publication date Jul 26, 2012
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
Silicon Filter for Photoluminescence Metrology
- Publication number 20110141460
- Publication date Jun 16, 2011
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
Procedure for in-situ determination of thermal gradients at the cry...
- Publication number 20100024718
- Publication date Feb 4, 2010
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR DETERMINING A MINORITY CARRIER DIFFUSION LENGTH USING SU...
- Publication number 20080116909
- Publication date May 22, 2008
- SUMCO CORPORATION
- Benno ORSCHEL
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING...
- Publication number 20070007466
- Publication date Jan 11, 2007
- Nicolas LAURENT
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for non-contact assessment of a constituent in...
- Publication number 20070008526
- Publication date Jan 11, 2007
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and methods for detecting defects in semiconductor work...
- Publication number 20070000434
- Publication date Jan 4, 2007
- Accent Optical Technologies, Inc.
- Andrzej Buczkowski
- G01 - MEASURING TESTING

Andrzej Buczkowski

Person

Patents Grantslast 30 patents

Optical metrology system for spectral imaging of a sample

Optical metrology system for spectral imaging of a sample

Procedure for in-situ determination of thermal gradients at the cry...

Silicon filter for photoluminescence metrology

Procedure for in-situ determination of thermal gradients at the cry...

Method for determining a minority carrier diffusion length using su...

Differential wavelength photoluminescence for non-contact measuring...

Patents Applicationslast 30 patents

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

PROCEDURE FOR IN-SITU DETERMINATION OF THERMAL GRADIENTS AT THE CRY...

Silicon Filter for Photoluminescence Metrology

Procedure for in-situ determination of thermal gradients at the cry...

METHOD FOR DETERMINING A MINORITY CARRIER DIFFUSION LENGTH USING SU...

DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING...

Apparatus and method for non-contact assessment of a constituent in...

Apparatuses and methods for detecting defects in semiconductor work...