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Andrzej Wlodzimierz Nawrocki
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Port Coquitlam, CA
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last 30 patents
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Patent Grant
Level measurement using correlation between a pair of secondary ref...
Patent number
9,618,617
Issue date
Apr 11, 2017
Honeywell International Inc.
Andrzej Wlodzimierz Nawrocki
G01 - MEASURING TESTING
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Patent Grant
Method for testing embedded systems
Patent number
9,494,651
Issue date
Nov 15, 2016
Honeywell Limited
Andrzej Wlodzimierz Nawrocki
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
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Patent Application
LEVEL MEASUREMENT USING CORRELATION BETWEEN A PAIR OF SECONDARY REF...
Publication number
20160274234
Publication date
Sep 22, 2016
Honeywell International Inc.
ANDRZEJ WLODZIMIERZ NAWROCKI
G01 - MEASURING TESTING
Information
Patent Application
Method for Testing Embedded Systems
Publication number
20160202310
Publication date
Jul 14, 2016
Honeywell ASCA Inc.
Andrzej Wlodzimierz Nawrocki
G01 - MEASURING TESTING