Andy Price

Person

Bonnyrigg, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer level microstructures for an optical lens
- Patent number 11,747,529
- Issue date Sep 5, 2023
- STMicroelectronics (Research & Development) Limited
- Kevin Channon
- G01 - MEASURING TESTING
Information Patent Grant
Molded range and proximity sensor with optical resin lens
- Patent number 11,693,149
- Issue date Jul 4, 2023
- STMicroelectronics (Research & Development) Limited
- Wing Shenq Wong
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level microstructures for an optical lens
- Patent number 11,187,837
- Issue date Nov 30, 2021
- STMicroelectronics (Research & Development) Limited
- Kevin Channon
- G01 - MEASURING TESTING
Information Patent Grant
Molded range and proximity sensor with optical resin lens
- Patent number 11,137,517
- Issue date Oct 5, 2021
- STMicroelectronics (Research & Development) Limited
- Wing Shenq Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Molded range and proximity sensor with optical resin lens
- Patent number 10,684,389
- Issue date Jun 16, 2020
- STMicroelectronics (Research & Development) Limited
- Wing Shenq Wong
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level microstructures for an optical lens
- Patent number 10,473,834
- Issue date Nov 12, 2019
- STMicroelectronics (Research & Development) Limited
- Kevin Channon
- G02 - OPTICS
Information Patent Grant
Optical module and method
- Patent number 9,876,973
- Issue date Jan 23, 2018
- STMicroelectronics (Research & Development) Limited
- Andy Price
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dark current calibration for a photosensitive device
- Patent number 9,310,247
- Issue date Apr 12, 2016
- STMicroelectronics (Research & Development) Limited
- Jeffrey M. Raynor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS
- Publication number 20230367047
- Publication date Nov 16, 2023
- STMicroelectronics (Research and Development) Limited
- Kevin CHANNON
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS
- Publication number 20220057553
- Publication date Feb 24, 2022
- STMicroelectronics (Research and Development) Limited
- Kevin CHANNON
- G01 - MEASURING TESTING
Information Patent Application
MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS
- Publication number 20210382197
- Publication date Dec 9, 2021
- STMicroelectronics (Research and Development) Limited
- Wing Shenq Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS
- Publication number 20200301042
- Publication date Sep 24, 2020
- STMicroelectronics (Research and Development) Limited
- Wing Shenq Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS
- Publication number 20200041704
- Publication date Feb 6, 2020
- STMicroelectronics (Research and Development) Limited
- Kevin CHANNON
- G02 - OPTICS
Information Patent Application
MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS
- Publication number 20190004207
- Publication date Jan 3, 2019
- STMicroelectronics Pte Ltd
- Wing Shenq Wong
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS
- Publication number 20180143359
- Publication date May 24, 2018
- STMicroelectronics (Research and Development) Limited
- Kevin CHANNON
- G02 - OPTICS
Information Patent Application
MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS
- Publication number 20170052277
- Publication date Feb 23, 2017
- STMicroelectronics Pte Ltd
- Wing Shenq Wong
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND METHOD
- Publication number 20160112666
- Publication date Apr 21, 2016
- STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITED
- Andy Price
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DARK CURRENT CALIBRATION FOR A PHOTOSENSITIVE DEVICE
- Publication number 20140353471
- Publication date Dec 4, 2014
- STMicroelectronics (Research and Development) Limited
- Jeffrey M. Raynor
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Wafer level microstructures for an optical lens

Molded range and proximity sensor with optical resin lens

Wafer level microstructures for an optical lens

Molded range and proximity sensor with optical resin lens

Molded range and proximity sensor with optical resin lens

Wafer level microstructures for an optical lens

Optical module and method

Dark current calibration for a photosensitive device

Patents Applicationslast 30 patents

WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS

WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS

MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS

MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS

WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS

MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS

WAFER LEVEL MICROSTRUCTURES FOR AN OPTICAL LENS

MOLDED RANGE AND PROXIMITY SENSOR WITH OPTICAL RESIN LENS

OPTICAL MODULE AND METHOD

DARK CURRENT CALIBRATION FOR A PHOTOSENSITIVE DEVICE