Andy Ray

Person

Newburyport, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of mixing upstream and downstream current measurements for i...
- Patent number 11,646,175
- Issue date May 9, 2023
- Axcelis Technologies, Inc.
- James DeLuca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for comparing customer records
- Patent number 10,803,102
- Issue date Oct 13, 2020
- Walmart Apollo, LLC
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Beam profiling speed enhancement for scanned beam implanters
- Patent number 10,483,086
- Issue date Nov 19, 2019
- Axcelis Technologies, Inc.
- Andy M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporally consistent group keys
- Patent number 10,007,689
- Issue date Jun 26, 2018
- Walmart Apollo, LLC
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for hierarchical blocking
- Patent number 9,830,377
- Issue date Nov 28, 2017
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for focused multi-blocking to increase link ident...
- Patent number 9,760,654
- Issue date Sep 12, 2017
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to improve productivity of hybrid scan ion beam i...
- Patent number 9,711,329
- Issue date Jul 18, 2017
- Axelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Name comparison
- Patent number 9,691,075
- Issue date Jun 27, 2017
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resolving pairwise links to groups
- Patent number 9,536,267
- Issue date Jan 3, 2017
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Implant-induced damage control in ion implantation
- Patent number 9,490,185
- Issue date Nov 8, 2016
- Axcelis Technologies, Inc.
- Ronald N. Reece
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Block partitioning for efficient record processing in parallel comp...
- Patent number 9,384,238
- Issue date Jul 5, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decision tree with compensation for previously unseen data
- Patent number 9,355,369
- Issue date May 31, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decision tree with just-in-time nodal computations
- Patent number 9,336,249
- Issue date May 10, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resolving pairwise links to groups
- Patent number 9,298,753
- Issue date Mar 29, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decision-tree based quantitative and qualitative record classification
- Patent number 9,292,599
- Issue date Mar 22, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for multi-block overlap-detection in a parallel e...
- Patent number 9,235,592
- Issue date Jan 12, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Use of beam scanning to improve uniformity and productivity of a 2D...
- Patent number 9,147,554
- Issue date Sep 29, 2015
- Axcelis Technologies, Inc.
- Andy Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filters, systems and methods for reducing can velocity
- Patent number 8,900,339
- Issue date Dec 2, 2014
- BHA Altair, LLC
- Andrew Alan Ray
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
System and method for ion implantation with improved productivity a...
- Patent number 8,502,173
- Issue date Aug 6, 2013
- Axcelis Technologies. Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Uniformity of a scanned ion beam
- Patent number 8,378,313
- Issue date Feb 19, 2013
- Axcelis Technologies, Inc.
- Edward C. Eisner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for ion implantation with improved productivity a...
- Patent number 8,278,634
- Issue date Oct 2, 2012
- Axcelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleaning pressure reduction through blowpipes
- Patent number 8,029,607
- Issue date Oct 4, 2011
- BHA Group, Inc.
- Andrew Ray
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Control of particles on semiconductor wafers when implanting boron...
- Patent number 7,994,487
- Issue date Aug 9, 2011
- Axcelis Technologies, Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simplified wafer alignment
- Patent number 7,453,160
- Issue date Nov 18, 2008
- Axcelis Technologies, Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring ion beam position
- Patent number 7,417,242
- Issue date Aug 26, 2008
- Axcelis Technologies, Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modulating ion beam current
- Patent number 6,992,308
- Issue date Jan 31, 2006
- Axcelis Technologies, Inc.
- Michael A. Graf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measurement of beam angle and divergence
- Patent number 6,989,545
- Issue date Jan 24, 2006
- Axcelis Technologies, Inc.
- Robert D. Rathmell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam utilization during scanned ion implantation
- Patent number 6,953,942
- Issue date Oct 11, 2005
- Axcelis Technologies, Inc.
- Michael A. Graf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of correction for wafer crystal cut error in semiconductor p...
- Patent number 6,940,079
- Issue date Sep 6, 2005
- Axcelis Technologies, Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam scanning systems and methods for improved ion implantation...
- Patent number 6,903,350
- Issue date Jun 7, 2005
- Axcelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MIXING UPSTREAM AND DOWNSTREAM CURRENT MEASUREMENTS FOR I...
- Publication number 20200266032
- Publication date Aug 20, 2020
- Axcelis Technologies, Inc.
- James DeLuca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Profiling Speed Enhancement for Scanned Beam Implanters
- Publication number 20160189926
- Publication date Jun 30, 2016
- Axcelis Technologies, Inc.
- Andy M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD TO IMPROVE PRODUCTIVITY OF HYBRID SCAN ION BEAM I...
- Publication number 20160189928
- Publication date Jun 30, 2016
- Axcelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESOLVING PAIRWISE LINKS TO GROUPS
- Publication number 20160148320
- Publication date May 26, 2016
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESOLVING PAIRWISE LINKS TO GROUPS
- Publication number 20140358920
- Publication date Dec 4, 2014
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Decision Tree With Just-In-Time Nodal Computations
- Publication number 20140324897
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Missing String Compensation In Capped Customer Linkage Model
- Publication number 20140324523
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVOLVING A CAPPED CUSTOMER LINKAGE MODEL USING GENETIC MODELS
- Publication number 20140324524
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Decision Tree With Compensation For Previously Unseen Data
- Publication number 20140324744
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DECISION TREE WITH SET-BASED NODAL COMPARISONS
- Publication number 20140324756
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FOCUSED MULTI-BLOCKING TO INCREASE LINK IDENT...
- Publication number 20140324906
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Block Partitioning For Efficient Record Processing In Parallel Comp...
- Publication number 20140324861
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DECISION-TREE BASED QUANTITATIVE AND QUALITATIVE RECORD CLASSIFICATION
- Publication number 20140324871
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MULTI-BLOCK OVERLAP-DETECTION IN A PARALLEL E...
- Publication number 20140324790
- Publication date Oct 30, 2014
- Wal-Mart Stores, Inc.
- Andrew Benjamin Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPLANT-INDUCED DAMAGE CONTROL IN ION IMPLANTATION
- Publication number 20140065730
- Publication date Mar 6, 2014
- Axcelis Technologies, Inc.
- Ronald N. Reece
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Filters, Systems and Methods for Reducing Can Velocity
- Publication number 20130092642
- Publication date Apr 18, 2013
- GENERAL ELECTRIC COMPANY
- Andrew Alan Ray
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
System and Method for Ion Implantation with Improved Productivity a...
- Publication number 20130026356
- Publication date Jan 31, 2013
- Axcelis Technologies Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Uniformity of a Scanned Ion Beam
- Publication number 20120248326
- Publication date Oct 4, 2012
- Axcelis Technologies, Inc.
- Edward C. Eisner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Use of Beam Scanning to Improve Uniformity and Productivity of a 2D...
- Publication number 20110001059
- Publication date Jan 6, 2011
- Axcelis Technologies, Inc.
- Andy Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Ion Implantation with Improved Productivity a...
- Publication number 20100308215
- Publication date Dec 9, 2010
- Axcelis Technologies Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING PRESSURE REDUCTION THROUGH BLOWPIPES
- Publication number 20100275776
- Publication date Nov 4, 2010
- BHA Group, Inc.
- Andrew Ray
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
CONTROL OF PARTICLES ON SEMICONDUCTOR WAFERS WHEN IMPLANTING BORON...
- Publication number 20090294698
- Publication date Dec 3, 2009
- Axcelis Technologies,Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optimization of a utilization of an ion beam in a two-dimensional m...
- Publication number 20060243920
- Publication date Nov 2, 2006
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of measuring ion beam position
- Publication number 20060219955
- Publication date Oct 5, 2006
- Axcelis Technologies, Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optimization of beam utilization
- Publication number 20060113489
- Publication date Jun 1, 2006
- Axcelis Technologies, Inc.
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dose uniformity during scanned ion implantation
- Publication number 20060097196
- Publication date May 11, 2006
- Axcelis Technologies Inc.
- Michael A. Graf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Communication device with image transmission operation and method t...
- Publication number 20060061662
- Publication date Mar 23, 2006
- Andrew E. Ray
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE AND METHOD FOR MEASUREMENT OF BEAM ANGLE AND DIVERGENCE NORM...
- Publication number 20060006346
- Publication date Jan 12, 2006
- Robert D. Rathmell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simplified wafer alignment
- Publication number 20050251279
- Publication date Nov 10, 2005
- Andrew M. Ray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modulating ion beam current
- Publication number 20050189500
- Publication date Sep 1, 2005
- Michael A. Graf
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method of mixing upstream and downstream current measurements for i...

Methods and systems for comparing customer records

Beam profiling speed enhancement for scanned beam implanters

Temporally consistent group keys

Methods and systems for hierarchical blocking

Method and system for focused multi-blocking to increase link ident...

System and method to improve productivity of hybrid scan ion beam i...

Name comparison

Resolving pairwise links to groups

Implant-induced damage control in ion implantation

Block partitioning for efficient record processing in parallel comp...

Decision tree with compensation for previously unseen data

Decision tree with just-in-time nodal computations

Resolving pairwise links to groups

Decision-tree based quantitative and qualitative record classification

Method and system for multi-block overlap-detection in a parallel e...

Use of beam scanning to improve uniformity and productivity of a 2D...

Filters, systems and methods for reducing can velocity

System and method for ion implantation with improved productivity a...

Uniformity of a scanned ion beam

System and method for ion implantation with improved productivity a...

Cleaning pressure reduction through blowpipes

Control of particles on semiconductor wafers when implanting boron...

Simplified wafer alignment

Method of measuring ion beam position

Modulating ion beam current

Device and method for measurement of beam angle and divergence

Ion beam utilization during scanned ion implantation

Method of correction for wafer crystal cut error in semiconductor p...

Ion beam scanning systems and methods for improved ion implantation...

Patents Applicationslast 30 patents

METHOD OF MIXING UPSTREAM AND DOWNSTREAM CURRENT MEASUREMENTS FOR I...

Beam Profiling Speed Enhancement for Scanned Beam Implanters

SYSTEM AND METHOD TO IMPROVE PRODUCTIVITY OF HYBRID SCAN ION BEAM I...

RESOLVING PAIRWISE LINKS TO GROUPS

RESOLVING PAIRWISE LINKS TO GROUPS

Decision Tree With Just-In-Time Nodal Computations

Missing String Compensation In Capped Customer Linkage Model

EVOLVING A CAPPED CUSTOMER LINKAGE MODEL USING GENETIC MODELS

Decision Tree With Compensation For Previously Unseen Data

DECISION TREE WITH SET-BASED NODAL COMPARISONS

METHOD AND SYSTEM FOR FOCUSED MULTI-BLOCKING TO INCREASE LINK IDENT...

Block Partitioning For Efficient Record Processing In Parallel Comp...

DECISION-TREE BASED QUANTITATIVE AND QUALITATIVE RECORD CLASSIFICATION

METHOD AND SYSTEM FOR MULTI-BLOCK OVERLAP-DETECTION IN A PARALLEL E...

IMPLANT-INDUCED DAMAGE CONTROL IN ION IMPLANTATION

Filters, Systems and Methods for Reducing Can Velocity

System and Method for Ion Implantation with Improved Productivity a...

Uniformity of a Scanned Ion Beam

Use of Beam Scanning to Improve Uniformity and Productivity of a 2D...

System and Method for Ion Implantation with Improved Productivity a...

CLEANING PRESSURE REDUCTION THROUGH BLOWPIPES

CONTROL OF PARTICLES ON SEMICONDUCTOR WAFERS WHEN IMPLANTING BORON...

Optimization of a utilization of an ion beam in a two-dimensional m...

Method of measuring ion beam position

Optimization of beam utilization

Dose uniformity during scanned ion implantation

Communication device with image transmission operation and method t...

DEVICE AND METHOD FOR MEASUREMENT OF BEAM ANGLE AND DIVERGENCE NORM...

Simplified wafer alignment

Modulating ion beam current