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Andy Szuromi
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Phoenix, AZ, US
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last 30 patents
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Patent Grant
Methods and systems for inspecting structures for crystallographic...
Patent number
8,605,858
Issue date
Dec 10, 2013
Honeywell International Inc.
Surendra Singh
G01 - MEASURING TESTING
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last 30 patents
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METHODS AND SYSTEMS FOR INSPECTING STRUCTURES FOR CRYSTALLOGRAPHIC...
Publication number
20120328079
Publication date
Dec 27, 2012
Honeywell International Inc.
Surendra Singh
G01 - MEASURING TESTING