Andy Tsen

Person

Chung-Ho City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for implementing a virtual metrology advanced pro...
- Patent number 8,437,870
- Issue date May 7, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for implementing multi-resolution advanced proces...
- Patent number 8,394,719
- Issue date Mar 12, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for implementing virtual metrology in semiconduct...
- Patent number 8,396,583
- Issue date Mar 12, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Advanced process control with novel sampling policy
- Patent number 8,392,009
- Issue date Mar 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Grant
Advanced process control for new tapeout product
- Patent number 8,239,056
- Issue date Aug 7, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Wei Hsu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for tuning advanced process control parameters
- Patent number 8,229,588
- Issue date Jul 24, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for advanced process control
- Patent number 8,224,475
- Issue date Jul 17, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for implementing wafer acceptance test (“WAT”) ad...
- Patent number 8,219,341
- Issue date Jul 10, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for implementing a wafer acceptance test (“WAT”)...
- Patent number 8,108,060
- Issue date Jan 31, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for a bin ratio forecast at new tape out stage
- Patent number 8,082,055
- Issue date Dec 20, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for bin-based control
- Patent number 8,041,451
- Issue date Oct 18, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for implementing multi-resolution advanced proces...
- Patent number 7,951,615
- Issue date May 31, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR IMPLEMENTING VIRTUAL METROLOGY IN SEMICONDUCT...
- Publication number 20110238198
- Publication date Sep 29, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING MULTI-RESOLUTION ADVANCED PROCES...
- Publication number 20110213478
- Publication date Sep 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Application
ADVANCED PROCESS CONTROL FOR NEW TAPEOUT PRODUCT
- Publication number 20110112678
- Publication date May 12, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Wei Hsu
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR A BIN RATIO FORECAST AT NEW TAPE OUT STAGE
- Publication number 20110010215
- Publication date Jan 13, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING A VIRTUAL METROLOGY ADVANCED PRO...
- Publication number 20100312374
- Publication date Dec 9, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING A WAFER ACCEPTANCE TEST ("WAT")...
- Publication number 20100292824
- Publication date Nov 18, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR BIN-BASED CONTROL
- Publication number 20100268367
- Publication date Oct 21, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING MULTI-RESOLUTION ADVANCED PROCES...
- Publication number 20100255613
- Publication date Oct 7, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Application
ADVANCED PROCESS CONTROL WITH NOVEL SAMPLING POLICY
- Publication number 20100249974
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING WAFER ACCEPTANCE TEST ("WAT") AD...
- Publication number 20100250172
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ADVANCED PROCESS CONTROL
- Publication number 20100234970
- Publication date Sep 16, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR TUNING ADVANCED PROCESS CONTROL PARAMETERS
- Publication number 20100228370
- Publication date Sep 9, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING

Person

Patents Grantslast 30 patents

System and method for implementing a virtual metrology advanced pro...

System and method for implementing multi-resolution advanced proces...

Method and system for implementing virtual metrology in semiconduct...

Advanced process control with novel sampling policy

Advanced process control for new tapeout product

Method and system for tuning advanced process control parameters

Method and apparatus for advanced process control

System and method for implementing wafer acceptance test (“WAT”) ad...

System and method for implementing a wafer acceptance test (“WAT”)...

Method for a bin ratio forecast at new tape out stage

Method for bin-based control

System and method for implementing multi-resolution advanced proces...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR IMPLEMENTING VIRTUAL METROLOGY IN SEMICONDUCT...

SYSTEM AND METHOD FOR IMPLEMENTING MULTI-RESOLUTION ADVANCED PROCES...

ADVANCED PROCESS CONTROL FOR NEW TAPEOUT PRODUCT

METHOD FOR A BIN RATIO FORECAST AT NEW TAPE OUT STAGE

SYSTEM AND METHOD FOR IMPLEMENTING A VIRTUAL METROLOGY ADVANCED PRO...

SYSTEM AND METHOD FOR IMPLEMENTING A WAFER ACCEPTANCE TEST ("WAT")...

METHOD FOR BIN-BASED CONTROL

SYSTEM AND METHOD FOR IMPLEMENTING MULTI-RESOLUTION ADVANCED PROCES...

ADVANCED PROCESS CONTROL WITH NOVEL SAMPLING POLICY

SYSTEM AND METHOD FOR IMPLEMENTING WAFER ACCEPTANCE TEST ("WAT") AD...

METHOD AND APPARATUS FOR ADVANCED PROCESS CONTROL

METHOD AND SYSTEM FOR TUNING ADVANCED PROCESS CONTROL PARAMETERS