Ang Chen

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Shanghai, CN

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Patents Applicationslast 30 patents

Information Patent Application
METHOD, SYSTEM, COMPUTING DEVICE AND STORAGE MEDIUM FOR OPTICAL MEA...
- Publication number 20230408544
- Publication date Dec 21, 2023
- Shanghai Ideaoptics Corp., Ltd.
- Tongyu Li
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND SYSTEM FOR CRITICAL DIMENSIONS BASED ON DISPER...
- Publication number 20230213870
- Publication date Jul 6, 2023
- Fudan University
- Tongyu Li
- G01 - MEASURING TESTING