Angelo Rossoni

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Brescia, IT

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Patents Grantslast 30 patents

Information Patent Grant
Layout for DUT arrays used in semiconductor wafer testing
- Patent number 7,489,151
- Issue date Feb 10, 2009
- PDF Solutions, Inc.
- Christopher Hess
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LAYOUT FOR DUT ARRAYS USED IN SEMICONDUCTOR WAFER TESTING
- Publication number 20090140762
- Publication date Jun 4, 2009
- PDF Solutions, Inc.
- Christopher Hess
- G01 - MEASURING TESTING
Information Patent Application
Layout for DUT arrays used in semiconductor wafer testing
- Publication number 20070075718
- Publication date Apr 5, 2007
- PDF Solutions, Inc.
- Christopher Hess
- G01 - MEASURING TESTING