Angus BEWICK

Person

Abingdon, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Collision avoidance for particle beam instruments
- Patent number 11,798,774
- Issue date Oct 24, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Stuart Andrew Swan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for electron diffraction analysis
- Patent number 11,195,692
- Issue date Dec 7, 2021
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collision avoidance for particle beam instruments
- Patent number 11,139,137
- Issue date Oct 5, 2021
- Oxford Instruments Nanotechnology Tools Limited
- Stuart Andrew Swan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for performing microdiffraction analysis
- Patent number 8,890,065
- Issue date Nov 18, 2014
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle filter
- Patent number 8,049,182
- Issue date Nov 1, 2011
- Oxford Instruments Nanotechnology Tools Limited
- Angus Bewick
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
- Publication number 20230175991
- Publication date Jun 8, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Robert MASTERS
- G01 - MEASURING TESTING
Information Patent Application
COLLISION AVOIDANCE FOR PARTICLE BEAM INSTRUMENTS
- Publication number 20210375577
- Publication date Dec 2, 2021
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Stuart Andrew Swan
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS
- Publication number 20200273663
- Publication date Aug 27, 2020
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION AVOIDANCE FOR PARTICLE BEAM INSTRUMENTS
- Publication number 20200168429
- Publication date May 28, 2020
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Stuart Andrew Swan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING MICRODIFFRACTION ANALYSIS
- Publication number 20140252226
- Publication date Sep 11, 2014
- Peter J. Statham
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSER
- Publication number 20120273679
- Publication date Nov 1, 2012
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD
- Angus Bewick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE FILTER
- Publication number 20110168887
- Publication date Jul 14, 2011
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Angus BEWICK
- H01 - BASIC ELECTRIC ELEMENTS

Angus BEWICK

Person

Patents Grantslast 30 patents

Collision avoidance for particle beam instruments

System for electron diffraction analysis

Collision avoidance for particle beam instruments

Apparatus and method for performing microdiffraction analysis

Charged particle filter

Patents Applicationslast 30 patents

IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS

COLLISION AVOIDANCE FOR PARTICLE BEAM INSTRUMENTS

IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS

COLLISION AVOIDANCE FOR PARTICLE BEAM INSTRUMENTS

APPARATUS AND METHOD FOR PERFORMING MICRODIFFRACTION ANALYSIS

X-RAY ANALYSER

CHARGED PARTICLE FILTER