Anh T. Hoang

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for power glitch detection in integrated circuits
- Patent number 9,541,603
- Issue date Jan 10, 2017
- Apple Inc.
- Brian S. Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Noise rejection for built-in self-test with loopback
- Patent number 8,904,248
- Issue date Dec 2, 2014
- Apple Inc.
- Brian S. Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing integrated circuits with hysteresis
- Patent number 8,836,366
- Issue date Sep 16, 2014
- Apple Inc.
- Anh T. Hoang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for clock glitch detection during at-speed tes...
- Patent number 8,793,545
- Issue date Jul 29, 2014
- Apple Inc.
- Ravi K. Ramaswami
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and methods for speed characterization
- Patent number 8,593,196
- Issue date Nov 26, 2013
- Apple Inc.
- Ravi Karapatti Ramaswami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Power Glitch Detection in Integrated Circuits
- Publication number 20150015283
- Publication date Jan 15, 2015
- Apple Inc.
- Brian S. Park
- G01 - MEASURING TESTING
Information Patent Application
Noise Rejection for Built-In Self-Test with Loopback
- Publication number 20140019817
- Publication date Jan 16, 2014
- Brian S. Park
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Clock Glitch Detection During At-Speed Tes...
- Publication number 20140013173
- Publication date Jan 9, 2014
- Ravi K. Ramaswami
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHODS FOR SPEED CHARACTERIZATION
- Publication number 20130093488
- Publication date Apr 18, 2013
- Ravi Karapatti Ramaswami
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUITS WITH HYSTERESIS
- Publication number 20130088254
- Publication date Apr 11, 2013
- Anh T. Hoang
- G01 - MEASURING TESTING