Anh-Tai Thai Nguyen

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Gilbert, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Low force interconnects for probe cards
- Patent number 7,733,104
- Issue date Jun 8, 2010
- SV Probe Pte. Ltd.
- John McGlory
- G01 - MEASURING TESTING
Information Patent Grant
Beam assembly method for large area array multi-beam DUT probe cards
- Patent number 7,637,006
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Low Force Interconnects For Probe Cards
- Publication number 20090261849
- Publication date Oct 22, 2009
- John McGlory
- G01 - MEASURING TESTING
Information Patent Application
Reinforced probes for testing semiconductor devices
- Publication number 20060028220
- Publication date Feb 9, 2006
- K&S Interconnect, Inc.
- Edward L. Malantonio
- G01 - MEASURING TESTING