Anhao CHENG

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Partial metal grain size control to improve CMP loading effect
- Patent number 12,363,987
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Barrier layer for metal insulator metal capacitors
- Patent number 12,218,181
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Barrier layer for metal insulator metal capacitors
- Patent number 12,211,890
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate structure and methods thereof
- Patent number 12,166,104
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices and methods of manufacturing thereof
- Patent number 12,074,024
- Issue date Aug 27, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Lei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a dual material redistribution line
- Patent number 12,027,447
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Partial metal grain size control to improve CMP loading effect
- Patent number 11,978,781
- Issue date May 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for interlevel dielectric layer with regions o...
- Patent number 11,955,421
- Issue date Apr 9, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate structure and methods thereof
- Patent number 11,799,014
- Issue date Oct 24, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming semiconductor device having a dual material redis...
- Patent number 11,410,882
- Issue date Aug 9, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a redistribution line
- Patent number 11,373,970
- Issue date Jun 28, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate structure and methods thereof
- Patent number 11,227,935
- Issue date Jan 18, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming semiconductor device having a dual material redis...
- Patent number 10,811,314
- Issue date Oct 20, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Redistribution layer structure and fabrication method therefor
- Patent number 10,541,218
- Issue date Jan 21, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate structure and methods thereof
- Patent number 10,431,664
- Issue date Oct 1, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao Cheng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device having a dual material redistribution line
- Patent number 9,991,189
- Issue date Jun 5, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Anhao Cheng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR STRUCTURE INCLUDING IMAGE SENSOR AND MRAM DEVICE
- Publication number 20250228027
- Publication date Jul 10, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YU-FANG CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT STRUCTURE WITH CAPACITOR AND METHODS FOR MAKING
- Publication number 20250210508
- Publication date Jun 26, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ke-Jing Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Barrier Layer for Metal Insulator Metal Capacitors
- Publication number 20250142848
- Publication date May 1, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH GATE EXTENSIONS AND METHODS OF FABRICATI...
- Publication number 20250133715
- Publication date Apr 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Fang Chiu
Information Patent Application
SYSTEM AND METHOD FOR PATTERNED LAYER DESIGN AND FORMATION
- Publication number 20250123553
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Chen CHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250089275
- Publication date Mar 13, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hui-Hung Shen
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
- Publication number 20250072070
- Publication date Feb 27, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Chen An Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
- Publication number 20250063813
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Hsuan Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR STRUCTURE AND METHODS OF FORMING THE SAME
- Publication number 20250056819
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Lun Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250054764
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- KE-JING YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHODS OF FORMATION
- Publication number 20250046739
- Publication date Feb 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-Hao HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metal-Oxide-Semiconductor Capacitors and Methods of Fabricating The...
- Publication number 20250040157
- Publication date Jan 30, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Liang Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SMALL DUMMY POLY PATTERN INSERTION IN SMALL BORDER REGIONS
- Publication number 20250022870
- Publication date Jan 16, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Anhao Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20240371634
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Lei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR INTERLEVEL DIELECTRIC LAYER WITH REGIONS O...
- Publication number 20240250018
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LARGE DIMENSION METAL GATE FIELD-EFFECT TRANSISTOR (FET) WITH METAL...
- Publication number 20240186397
- Publication date Jun 6, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Chen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
- Publication number 20240105751
- Publication date Mar 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Lei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMBEDDED SOI STRUCTURE FOR LOW LEAKAGE MOS CAPACITOR
- Publication number 20240071812
- Publication date Feb 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Lei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240021738
- Publication date Jan 18, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- ANHAO CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTIAL METAL GRAIN SIZE CONTROL TO IMPROVE CMP LOADING EFFECT
- Publication number 20230387244
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STRUCTURE AND METHODS THEREOF
- Publication number 20230369450
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20230207313
- Publication date Jun 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Lei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTIAL METAL GRAIN SIZE CONTROL TO IMPROVE CMP LOADING EFFECT
- Publication number 20230063995
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR MULTIPLE BEOL K-VALUE DIELECTRIC
- Publication number 20230061546
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER LAYER FOR METAL INSULATOR METAL CAPACITORS
- Publication number 20220367606
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A DUAL MATERIAL REDISTRIBUTION LINE
- Publication number 20220352022
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A REDISTRIBUTION LINE
- Publication number 20220302060
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STRUCTURE AND METHODS THEREOF
- Publication number 20220140109
- Publication date May 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER LAYER FOR METAL INSULATOR METAL CAPACITORS
- Publication number 20210305356
- Publication date Sep 30, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING SEMICONDUCTOR DEVICE HAVING A DUAL MATERIAL REDIS...
- Publication number 20210020506
- Publication date Jan 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Anhao CHENG
- H01 - BASIC ELECTRIC ELEMENTS

Anhao CHENG

Person

Patents Grantslast 30 patents

Partial metal grain size control to improve CMP loading effect

Barrier layer for metal insulator metal capacitors

Barrier layer for metal insulator metal capacitors

Gate structure and methods thereof

Semiconductor devices and methods of manufacturing thereof

Semiconductor device having a dual material redistribution line

Partial metal grain size control to improve CMP loading effect

Structure and method for interlevel dielectric layer with regions o...

Gate structure and methods thereof

Method of forming semiconductor device having a dual material redis...

Semiconductor device having a redistribution line

Gate structure and methods thereof

Method of forming semiconductor device having a dual material redis...

Redistribution layer structure and fabrication method therefor

Gate structure and methods thereof

Semiconductor device having a dual material redistribution line

Patents Applicationslast 30 patents

SEMICONDUCTOR STRUCTURE INCLUDING IMAGE SENSOR AND MRAM DEVICE

INTERCONNECT STRUCTURE WITH CAPACITOR AND METHODS FOR MAKING

Barrier Layer for Metal Insulator Metal Capacitors

SEMICONDUCTOR DEVICES WITH GATE EXTENSIONS AND METHODS OF FABRICATI...

SYSTEM AND METHOD FOR PATTERNED LAYER DESIGN AND FORMATION

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME

CAPACITOR STRUCTURE AND METHODS OF FORMING THE SAME

SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHODS OF FORMATION

Metal-Oxide-Semiconductor Capacitors and Methods of Fabricating The...

SMALL DUMMY POLY PATTERN INSERTION IN SMALL BORDER REGIONS

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF

STRUCTURE AND METHOD FOR INTERLEVEL DIELECTRIC LAYER WITH REGIONS O...

LARGE DIMENSION METAL GATE FIELD-EFFECT TRANSISTOR (FET) WITH METAL...

SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME

EMBEDDED SOI STRUCTURE FOR LOW LEAKAGE MOS CAPACITOR

SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME

PARTIAL METAL GRAIN SIZE CONTROL TO IMPROVE CMP LOADING EFFECT

GATE STRUCTURE AND METHODS THEREOF

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF

PARTIAL METAL GRAIN SIZE CONTROL TO IMPROVE CMP LOADING EFFECT

STRUCTURE AND METHOD FOR MULTIPLE BEOL K-VALUE DIELECTRIC

BARRIER LAYER FOR METAL INSULATOR METAL CAPACITORS

SEMICONDUCTOR DEVICE HAVING A DUAL MATERIAL REDISTRIBUTION LINE

SEMICONDUCTOR DEVICE HAVING A REDISTRIBUTION LINE

GATE STRUCTURE AND METHODS THEREOF

BARRIER LAYER FOR METAL INSULATOR METAL CAPACITORS

METHOD OF FORMING SEMICONDUCTOR DEVICE HAVING A DUAL MATERIAL REDIS...