Anil A. Desai

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system of using a scanning electron microscope in semico...
- Patent number 6,791,095
- Issue date Sep 14, 2004
- Hermes-Microvision (Taiwan) Inc.
- Chung-Shih Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,578,821
- Issue date Nov 26, 1996
- KLA Instruments Corporation
- Dan Meisberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING
Information Patent Grant
Rotational and focusing apparatus for turret mounted lenses
- Patent number 4,647,764
- Issue date Mar 3, 1987
- KLA Instruments Corporation
- Curt H. Chadwick
- G02 - OPTICS
Information Patent Grant
Apparatus for accurately positioning an object at each of two locat...
- Patent number 4,604,910
- Issue date Aug 12, 1986
- KLA Instruments Corporation
- Curt H. Chadwick
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method and system of using a scanning electron microscope in semico...
- Publication number 20030178576
- Publication date Sep 25, 2003
- Chung-Shih Pan
- H01 - BASIC ELECTRIC ELEMENTS