Anil Malik

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New Delhi, IN

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Patents Grantslast 30 patents

Information Patent Grant
Scan channel slicing for compression-mode testing of scan chains
- Patent number 11,592,482
- Issue date Feb 28, 2023
- Cadence Design Systems, Inc.
- Sameer Chakravarthy Chillarige
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multiple device diagnostics and failure grouping
- Patent number 10,996,270
- Issue date May 4, 2021
- Cadence Design Systems, Inc.
- Sameer Chillarige
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Highly accurate defect identification and prioritization of fault l...
- Patent number 10,338,137
- Issue date Jul 2, 2019
- Cadence Design Systems, Inc.
- Sameer Chakravarthy Chillarige
- G01 - MEASURING TESTING
Information Patent Grant
System and method performing scan chain diagnosis of an electronic...
- Patent number 10,180,457
- Issue date Jan 15, 2019
- Cadence Design Systems, Inc.
- Sameer Chakravarthy Chillarige
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for diagnosing failure locations in electronic ci...
- Patent number 9,864,004
- Issue date Jan 9, 2018
- Cadence Design Systems, Inc.
- Sameer Chakravarthy Chillarige
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of collective failure diagnosis for multiple elec...
- Patent number 9,400,311
- Issue date Jul 26, 2016
- Cadence Design Systems, Inc.
- Anil Malik
- G01 - MEASURING TESTING