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Anindya Deb

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  • Salt Lake, IN
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Patents Grantslast 30 patents

  • Information Patent Grant

    System and method for intelligent defect analysis
    • Patent number 12,197,864
    • Issue date Jan 14, 2025
    • Cerner Innovation, Inc.
    • Soumya Basu
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Testing as a service
    • Patent number 11,636,029
    • Issue date Apr 25, 2023
    • Cerner Innovation, Inc.
    • Anindya Deb
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Testing as a service
    • Patent number 11,429,514
    • Issue date Aug 30, 2022
    • Cerner Innovation, Inc.
    • Anindya Deb
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TESTING AS A SERVICE
    • Publication number 20220391316
    • Publication date Dec 8, 2022
    • CERNER INNOVATION, INC.
    • Anindya Deb
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SYSTEM AND METHOD FOR INTELLIGENT DEFECT ANALYSIS
    • Publication number 20210200950
    • Publication date Jul 1, 2021
    • CERNER INNOVATION, INC.
    • Soumya Basu
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TESTING AS A SERVICE
    • Publication number 20210173766
    • Publication date Jun 10, 2021
    • CERNER INNOVATION, INC.
    • Anindya Deb
    • G06 - COMPUTING CALCULATING COUNTING