Aniruddha Bashar

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Laveen, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Accurate temperature measurement method for low beta transistors
- Patent number 7,332,952
- Issue date Feb 19, 2008
- Standard Microsystems Corporation
- Scott C. McLeod
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Accurate temperature measurement method for low beta transistors
- Publication number 20070115042
- Publication date May 24, 2007
- Scott C. McLeod
- G01 - MEASURING TESTING