Anjam Khursheed

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Cathode structure for cold field electron emission and method of fa...
- Patent number 11,158,479
- Issue date Oct 26, 2021
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration correction apparatus, device having the same, and method...
- Patent number 9,601,304
- Issue date Mar 21, 2017
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun configured to generate charged particles
- Patent number 9,093,243
- Issue date Jul 28, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel radial mirror analyser with an angled zero-volt equipotent...
- Patent number 8,981,292
- Issue date Mar 17, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sequential radial mirror analyser
- Patent number 8,723,114
- Issue date May 13, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic electron spectrometry apparatus
- Patent number 8,013,298
- Issue date Sep 6, 2011
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam ion/electron spectra-microscope
- Patent number 7,947,951
- Issue date May 24, 2011
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and a method of imaging objects
- Patent number 7,326,928
- Issue date Feb 5, 2008
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,294,834
- Issue date Nov 13, 2007
- National University of Singapore
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Grant
Lens for a scanning electron microscope
- Patent number 6,906,335
- Issue date Jun 14, 2005
- National University of Singapore
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Grant
Reducing chromatic aberration in images formed by emmission electrons
- Patent number 6,897,441
- Issue date May 24, 2005
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Converting scanning electron microscopes
- Patent number 6,891,159
- Issue date May 10, 2005
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable high resolution scanning electron microscope column using...
- Patent number 6,320,194
- Issue date Nov 20, 2001
- Institute of Materials Research and Engineering
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable high resolution scanning electron microscope column using...
- Patent number 6,057,553
- Issue date May 2, 2000
- Institute of Materials Research & Engineering
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CATHODE STRUCTURE FOR COLD FIELD ELECTRON EMISSION AND METHOD OF FA...
- Publication number 20210159038
- Publication date May 27, 2021
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A CORRECTOR STRUCTURE AND A METHOD FOR CORRECTING ABERRATION OF AN...
- Publication number 20190096629
- Publication date Mar 28, 2019
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION CORRECTION APPARATUS, DEVICE HAVING THE SAME, AND METHOD...
- Publication number 20160056011
- Publication date Feb 25, 2016
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN CONFIGURED TO GENERATE CHARGED PARTICLES
- Publication number 20140346368
- Publication date Nov 27, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES
- Publication number 20140042317
- Publication date Feb 13, 2014
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEQUENTIAL RADIAL MIRROR ANALYSER
- Publication number 20130126730
- Publication date May 23, 2013
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC ELECTRON SPECTROMETRY APPARATUS
- Publication number 20100127168
- Publication date May 27, 2010
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-beam ion/electron spectra-microscope
- Publication number 20090321634
- Publication date Dec 31, 2009
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope and a method of imaging objects
- Publication number 20060151696
- Publication date Jul 13, 2006
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20060060782
- Publication date Mar 23, 2006
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Application
Lens for a scanning electron microscope
- Publication number 20040084620
- Publication date May 6, 2004
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Application
Converting scanning electron microscopes
- Publication number 20040079884
- Publication date Apr 29, 2004
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing chromatic aberration in images formed by emmission electrons
- Publication number 20040004773
- Publication date Jan 8, 2004
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS

Anjam Khursheed

Person

Patents Grantslast 30 patents

Cathode structure for cold field electron emission and method of fa...

Aberration correction apparatus, device having the same, and method...

Gun configured to generate charged particles

Parallel radial mirror analyser with an angled zero-volt equipotent...

Sequential radial mirror analyser

Electrostatic electron spectrometry apparatus

Multi-beam ion/electron spectra-microscope

Electron microscope and a method of imaging objects

Scanning electron microscope

Lens for a scanning electron microscope

Reducing chromatic aberration in images formed by emmission electrons

Converting scanning electron microscopes

Portable high resolution scanning electron microscope column using...

Portable high resolution scanning electron microscope column using...

Patents Applicationslast 30 patents

CATHODE STRUCTURE FOR COLD FIELD ELECTRON EMISSION AND METHOD OF FA...

A CORRECTOR STRUCTURE AND A METHOD FOR CORRECTING ABERRATION OF AN...

ABERRATION CORRECTION APPARATUS, DEVICE HAVING THE SAME, AND METHOD...

GUN CONFIGURED TO GENERATE CHARGED PARTICLES

PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES

SEQUENTIAL RADIAL MIRROR ANALYSER

ELECTROSTATIC ELECTRON SPECTROMETRY APPARATUS

Multi-beam ion/electron spectra-microscope

Electron microscope and a method of imaging objects

Scanning electron microscope

Lens for a scanning electron microscope

Converting scanning electron microscopes

Reducing chromatic aberration in images formed by emmission electrons