Anjan Nayak

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Bengaluru, IN

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic process criticality scoring
- Patent number 11,966,787
- Issue date Apr 23, 2024
- McAfee LLC
- Raghavendra Satyanarayana Hebbalalu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mechanism to determine cellular signal reputation of a location and...
- Patent number 11,805,423
- Issue date Oct 31, 2023
- McAfee, LLC
- Raja Sinha
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for collective and collaborative navigation by a...
- Patent number 11,182,870
- Issue date Nov 23, 2021
- McAfee, LLC
- Dattatraya Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mechanism to determine cellular signal reputation of a location and...
- Patent number 11,166,170
- Issue date Nov 2, 2021
- McAfee, LLC
- Raja Sinha
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC PROCESS CRITICALITY SCORING
- Publication number 20240296074
- Publication date Sep 5, 2024
- McAfee, LLC
- Raghavendra Satyanarayana Hebbalalu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC PROCESS CRITICALITY SCORING
- Publication number 20220318061
- Publication date Oct 6, 2022
- McAfee, LLC
- Raghavendra Satyanarayana Hebbalalu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MECHANISM TO DETERMINE CELLULAR SIGNAL REPUTATION OF A LOCATION AND...
- Publication number 20220225113
- Publication date Jul 14, 2022
- MCAFEE, LLC
- Raja Sinha
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MECHANISM TO DETERMINE CELLULAR SIGNAL REPUTATION OF A LOCATION AND...
- Publication number 20200107201
- Publication date Apr 2, 2020
- MCAFEE, LLC
- Raja Sinha
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR COLLECTIVE AND COLLABORATIVE NAVIGATION BY A...
- Publication number 20160187141
- Publication date Jun 30, 2016
- McAfee, Inc.
- Dattatraya Kulkarni
- G01 - MEASURING TESTING