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Ankit Jain
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Ballston Spa, NY, US
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last 30 patents
Information
Patent Grant
Diagnostic methods for the classifiers and the defects captured by...
Patent number
11,237,119
Issue date
Feb 1, 2022
KLA-Tencor Corporation
Martin Plihal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System, method for training and applying defect classifiers in wafe...
Patent number
10,964,013
Issue date
Mar 30, 2021
KLA-Tencor Corporation
Martin Plihal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hybrid design layout to identify optical proximity correction-relat...
Patent number
10,796,065
Issue date
Oct 6, 2020
KLA-Tencor Corporation
Allen Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Mode selection for inspection
Patent number
10,670,536
Issue date
Jun 2, 2020
KLA-Tencor Corp.
Martin Plihal
G01 - MEASURING TESTING
Information
Patent Grant
Methods to store dynamic layer content inside a design file
Patent number
10,387,601
Issue date
Aug 20, 2019
KLA-Tencor Corporation
Thirupurasundari Jayaraman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Production sample shaping that preserves re-normalizability
Patent number
10,338,004
Issue date
Jul 2, 2019
KLA-Tencor Corp.
Martin Plihal
G01 - MEASURING TESTING
Information
Patent Grant
Optimizing training sets used for setting up inspection-related alg...
Patent number
10,267,748
Issue date
Apr 23, 2019
KLA-Tencor Corp.
Martin Plihal
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
HYBRID DESIGN LAYOUT TO IDENTIFY OPTICAL PROXIMITY CORRECTION-RELAT...
Publication number
20190392111
Publication date
Dec 26, 2019
KLA-Tencor Corporation
Allen Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Mode Selection for Inspection
Publication number
20190302031
Publication date
Oct 3, 2019
KLA-Tencor Corporation
Martin Plihal
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD FOR TRAINING AND APPLYING DEFECT CLASSIFIERS IN WAFE...
Publication number
20180204315
Publication date
Jul 19, 2018
KLA-Tencor Corporation
Martin Plihal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Diagnostic Methods for the Classifiers and the Defects Captured by...
Publication number
20180197714
Publication date
Jul 12, 2018
KLA-Tencor Corporation
Martin Plihal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optimizing Training Sets Used for Setting Up Inspection-Related Alg...
Publication number
20180106732
Publication date
Apr 19, 2018
KLA-Tencor Corporation
Martin Plihal
G01 - MEASURING TESTING
Information
Patent Application
Production Sample Shaping that Preserves Re-Normalizability
Publication number
20150276618
Publication date
Oct 1, 2015
KLA-Tencor Corporation
Martin Plihal
G01 - MEASURING TESTING