Ankit Vashi

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Temperature management for a memory device using memory trim sets
- Patent number 11,567,682
- Issue date Jan 31, 2023
- Micron Technology, Inc.
- Ting Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensitive NAND programming
- Patent number 11,488,670
- Issue date Nov 1, 2022
- Micron Technology, Inc.
- Xiangang Luo
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan optimization from stacking multiple reliability specifications
- Patent number 11,417,405
- Issue date Aug 16, 2022
- Micron Technology, Inc.
- Ankit Vinod Vashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensitive NAND programming
- Patent number 10,930,352
- Issue date Feb 23, 2021
- Micron Technology, Inc.
- Xiangang Luo
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan optimization from stacking multiple reliability specifications
- Patent number 10,892,024
- Issue date Jan 12, 2021
- Micron Technology, Inc.
- Ankit Vashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensitive NAND programming
- Patent number 10,446,237
- Issue date Oct 15, 2019
- Micron Technology, Inc.
- Xiangang Luo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
RELIABILITY BASED DATA VERIFICATION
- Publication number 20240038311
- Publication date Feb 1, 2024
- Micron Technology, Inc.
- Yu-Chung Lien
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE MANAGEMENT FOR A MEMORY DEVICE
- Publication number 20210149564
- Publication date May 20, 2021
- Micron Technology, Inc.
- Ting Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN OPTIMIZATION FROM STACKING MULTIPLE RELIABILITY SPECIFICATIONS
- Publication number 20210125675
- Publication date Apr 29, 2021
- Micron Technology, Inc.
- Ankit Vinod Vashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN OPTIMIZATION FROM STACKING MULTIPLE RELIABILITY SPECIFICATIONS
- Publication number 20200211664
- Publication date Jul 2, 2020
- Micron Technology, Inc.
- Ankit Vashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE SENSITIVE NAND PROGRAMMING
- Publication number 20200043555
- Publication date Feb 6, 2020
- Micron Technology, Inc.
- Xiangang Luo
- G11 - INFORMATION STORAGE