Membership
Tour
Register
Log in
Ankita PATIDAR
Follow
Person
Dublin, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods to detect cell-internal defects
Patent number
11,837,308
Issue date
Dec 5, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Ankita Patidar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fault diagnostics
Patent number
11,663,387
Issue date
May 30, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Sandeep Kumar Goel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods to detect cell-internal defects
Patent number
11,295,831
Issue date
Apr 5, 2022
Taiwan Semiconductor Manufacturing Company Limited
Ankita Patidar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Machine-learning based scan design enablement platform
Patent number
11,113,444
Issue date
Sep 7, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Sandeep Kumar Goel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for reducing migration errors
Patent number
11,055,455
Issue date
Jul 6, 2021
Taiwan Semiconductor Manufacturing Company Ltd.
Sandeep Kumar Goel
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
Publication number
20240087668
Publication date
Mar 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Ankita Patidar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAULT DIAGNOSTICS
Publication number
20230385498
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Sandeep Kumar Goel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR MODELING VIA DEFECT
Publication number
20230019641
Publication date
Jan 19, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Cheng-Yi LIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
Publication number
20220230699
Publication date
Jul 21, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Ankita Patidar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
Publication number
20210407614
Publication date
Dec 30, 2021
Taiwan Semiconductor Manufacturing Company Limited
Ankita Patidar
G11 - INFORMATION STORAGE
Information
Patent Application
FAULT DIAGNOSTICS
Publication number
20210350055
Publication date
Nov 11, 2021
Taiwan Semiconductor Manufacturing Company, Ltd.
Sandeep Kumar Goel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS
Publication number
20210192112
Publication date
Jun 24, 2021
Taiwan Semiconductor Manufacturing Company, Ltd.
Sandeep Kumar GOEL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MACHINE-LEARNING BASED SCAN DESIGN ENABLEMENT PLATFORM
Publication number
20200004913
Publication date
Jan 2, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Sandeep Kumar GOEL
G06 - COMPUTING CALCULATING COUNTING