Ankur Anchlia

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Indore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for measuring capacitance difference between capa...
- Patent number 9,411,000
- Issue date Aug 9, 2016
- IMEC
- Geert Van der Plas
- G01 - MEASURING TESTING
Information Patent Grant
Methods for characterization of electronic circuits under process v...
- Patent number 8,286,112
- Issue date Oct 9, 2012
- IMEC
- Miguel Miranda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPA...
- Publication number 20140372057
- Publication date Dec 18, 2014
- Geert Van der Plas
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ANALYZING PERFORMANCE METRICS OF ARRAY TYPE C...
- Publication number 20100250187
- Publication date Sep 30, 2010
- IMEC
- Paul Zuber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR CHARACTERIZATION OF ELECTRONIC CIRCUITS UNDER PROCESS V...
- Publication number 20090031268
- Publication date Jan 29, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Miguel Miranda
- G06 - COMPUTING CALCULATING COUNTING