Ann Poh Gan

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Sepang, MY

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Patents Applicationslast 30 patents

Information Patent Application
Boundary Scan Power Up Voltage Level Configuration
- Publication number 20250123328
- Publication date Apr 17, 2025
- Ching Sia Lim
- G01 - MEASURING TESTING
Information Patent Application
Techniques For Testing Leakage Current In Input And Output Circuits
- Publication number 20240402245
- Publication date Dec 5, 2024
- Altera Corporation
- Chiew Khiang Kuit
- G01 - MEASURING TESTING
Information Patent Application
Segmented Boundary Scan Chain Testing
- Publication number 20240353490
- Publication date Oct 24, 2024
- Ee Mei Ooi
- G01 - MEASURING TESTING