Ann Rundell

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West Lafayette, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
Optoelectronic detection system
- Patent number 9,005,989
- Issue date Apr 14, 2015
- Massachusetts Institute of Technology
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic detection system
- Patent number 7,947,509
- Issue date May 24, 2011
- Massachusetts Institute of Technology
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic detection system
- Patent number 7,214,346
- Issue date May 8, 2007
- Massachusetts Institute of Technology
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Grant
Reagent system for calibration of pipettes and other volumetric mea...
- Patent number 5,492,673
- Issue date Feb 20, 1996
- Artel, Inc.
- Richard H. Curtis
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Pipette calibration system
- Patent number 5,298,978
- Issue date Mar 29, 1994
- Artel, Inc.
- Richard H. Curtis
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
OPTOELECTRONIC DETECTION SYSTEM
- Publication number 20160161479
- Publication date Jun 9, 2016
- Massachusetts Institute of Technology
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC DETECTION SYSTEM
- Publication number 20150093745
- Publication date Apr 2, 2015
- Massachusetts Institute of Technology
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC DETECTION SYSTEM
- Publication number 20120190006
- Publication date Jul 26, 2012
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Application
Optoelectronic detection system
- Publication number 20080009017
- Publication date Jan 10, 2008
- James Douglas Harper
- G01 - MEASURING TESTING
Information Patent Application
Optoelectronic detection system
- Publication number 20040121402
- Publication date Jun 24, 2004
- James Douglas Harper
- G01 - MEASURING TESTING