Anna Lena Eberle

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Essingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of imaging a 2D sample with a multi-beam particle microscope
- Patent number 11,521,827
- Issue date Dec 6, 2022
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a 3D sample with a multi-beam particle microscope
- Patent number 11,069,508
- Issue date Jul 20, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF IMAGING A 2D SAMPLE WITH A MULTI-BEAM PARTICLE MICROSCOPE
- Publication number 20210351001
- Publication date Nov 11, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF IMAGING A 3D SAMPLE WITH A MULTI-BEAM PARTICLE MICROSCOPE
- Publication number 20200243300
- Publication date Jul 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS