Encinitas, CA, US
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United States of America as represented by the Secretary of the Navy
Sergio A Montoya
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
United States of America as represented by the Secretary of the Navy
Benjamin Taylor
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
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Patent Grant
United States of America as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
United States of America as represented by the Secretary of the Navy
Stephanie Claussen
G01 - MEASURING TESTING
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Patent Grant
United States of America as represented by Secretary of the Navy
Benjamin J Taylor
G01 - MEASURING TESTING
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Patent Grant
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
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The United States of America, as represented by the Secretary of the Navy
Marcio C. de Andrade
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Anna M. Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Osama Nayfeh
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America as represented by Secretary of the Navy
Susan Anne Elizabeth Berggren
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by Secretary of the Navy
Benjamin J. Taylor
G02 - OPTICS
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Patent Grant
The United States of America as represented by Secretary of the Navy
Osama M. Nayfeh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by Secretary of the Navy
Marcio C. de Andrade
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by Secretary of the Navy
Osama M. Nayfeh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Osama Nayfeh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Patrick Longhini
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Marclo C. de Andrade
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Marcio C. De Andrade
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The United States of America, as represented by the Secretary of the Navy
Sergio A. Montoya
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
The United States of America as represented by the Secretary of the Navy
Sergio A. Montoya
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The United States of America as represented by the Secretary of the Navy
Benjamin Taylor
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
United States of America as represented by Secretary of the Navy
Osama M. Nayfeh
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
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Patent Application
United States Governmnet as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The United States of America, as represented by the Secretary of the Navy
BENJAMIN J. TAYLOR
G01 - MEASURING TESTING
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Patent Application
United States of America as represented by Secretary of the Navy
Stephanie Claussen
G01 - MEASURING TESTING
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Patent Application
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
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Patent Application
United States of America as represented by Secretary of the Navy
Anna M. Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
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Patent Application
United States of America, as Represented by the Secretary of the Navy
Marcio C. de Andrade
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
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Patent Application
SPAWAR Systems Center Pacific
Osama M. Nayfeh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
United States of America, as Represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
