Anne Jourdain

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Methods of processing and inspecting semiconductor substrates
- Patent number 8,460,946
- Issue date Jun 11, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF PROCESSING AND INSPECTING SEMICONDUCTOR SUBSTRATES
- Publication number 20120094401
- Publication date Apr 19, 2012
- IMEC
- Lars Markwort
- G01 - MEASURING TESTING