Anping Qiu

Person

Hefei, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Ring oscillator and test method
- Patent number 12,113,535
- Issue date Oct 8, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chan Chen
- G01 - MEASURING TESTING
Information Patent Grant
OTP device with read module and biasing circuitry to detect and mea...
- Patent number 12,046,313
- Issue date Jul 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Anping Qiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Process variation detection circuit and process variation detection...
- Patent number 11,867,750
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES INC.
- Shengcheng Deng
- G01 - MEASURING TESTING
Information Patent Grant
Ring oscillator
- Patent number 11,855,637
- Issue date Dec 26, 2023
- Changxin Memory Technologies, Inc.
- Chan Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Process corner detection circuit and process corner detection method
- Patent number 11,573,263
- Issue date Feb 7, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shengcheng Deng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay circuit and delay structure
- Patent number 11,451,219
- Issue date Sep 20, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weibing Shang
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Drive Circuit and Memory Device
- Publication number 20240079038
- Publication date Mar 7, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhonglai Liu
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE DETECTION CIRCUIT AND VOLTAGE DETECTION METHOD
- Publication number 20230408557
- Publication date Dec 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Anping QIU
- G01 - MEASURING TESTING
Information Patent Application
RING OSCILLATOR AND TEST METHOD
- Publication number 20230299752
- Publication date Sep 21, 2023
- Changxin Memory Technologies, Inc.
- Chan CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
VOLTAGE OUTPUT TEST CIRCUIT, VOLTAGE DIVIDER OUTPUT CIRCUIT, AND ME...
- Publication number 20230267967
- Publication date Aug 24, 2023
- Changxin Memory Technologies, Inc.
- Chan CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
RING OSCILLATOR
- Publication number 20230253958
- Publication date Aug 10, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Chan CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANTI-FUSE MEMORY
- Publication number 20230230647
- Publication date Jul 20, 2023
- Changxin Memory Technologies, Inc.
- Anping QIU
- G11 - INFORMATION STORAGE
Information Patent Application
PROCESS VARIATION DETECTION CIRCUIT AND PROCESS VARIATION DETECTION...
- Publication number 20230057198
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shengcheng DENG
- G01 - MEASURING TESTING
Information Patent Application
PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHOD
- Publication number 20220276300
- Publication date Sep 1, 2022
- Shengcheng DENG
- G01 - MEASURING TESTING
Information Patent Application
DELAY CIRCUIT AND DELAY STRUCTURE
- Publication number 20220094344
- Publication date Mar 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Weibing Shang
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Ring oscillator and test method

OTP device with read module and biasing circuitry to detect and mea...

Process variation detection circuit and process variation detection...

Ring oscillator

Process corner detection circuit and process corner detection method

Delay circuit and delay structure

Patents Applicationslast 30 patents

Drive Circuit and Memory Device

VOLTAGE DETECTION CIRCUIT AND VOLTAGE DETECTION METHOD

RING OSCILLATOR AND TEST METHOD

VOLTAGE OUTPUT TEST CIRCUIT, VOLTAGE DIVIDER OUTPUT CIRCUIT, AND ME...

RING OSCILLATOR

ANTI-FUSE MEMORY

PROCESS VARIATION DETECTION CIRCUIT AND PROCESS VARIATION DETECTION...

PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHOD

DELAY CIRCUIT AND DELAY STRUCTURE