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Anthonius Ruiter
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Goleta, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,940,461
Issue date
Mar 26, 2024
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,635,449
Issue date
Apr 25, 2023
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,307,220
Issue date
Apr 19, 2022
BRUKER NANO
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,029,330
Issue date
Jun 8, 2021
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Low drift system for a metrology instrument
Patent number
10,900,997
Issue date
Jan 26, 2021
Bruker Nano, Inc.
Andrew Neushul
G01 - MEASURING TESTING
Information
Patent Grant
Low drift scanning probe microscope
Patent number
9,116,168
Issue date
Aug 25, 2015
Bruker Nano, Inc.
Anthonius G. Ruiter
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Low drift scanning probe microscope
Patent number
8,869,310
Issue date
Oct 21, 2014
Bruker Nano, Inc.
Anthonius Ruiter
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
Publication number
20240175895
Publication date
May 30, 2024
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20230243867
Publication date
Aug 3, 2023
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20220252638
Publication date
Aug 11, 2022
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20210239732
Publication date
Aug 5, 2021
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
Low Drift System for a Metrology Instrument
Publication number
20200166540
Publication date
May 28, 2020
Bruker Nano, Inc.
Andrew Neushul
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20200041541
Publication date
Feb 6, 2020
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
Low Drift Scanning Probe Microscope
Publication number
20150074859
Publication date
Mar 12, 2015
Bruker Nano, Inc.
Anthonius G. Ruiter
G01 - MEASURING TESTING
Information
Patent Application
Low Drift Scanning Probe Microscope
Publication number
20110239336
Publication date
Sep 29, 2011
BRUCKER NANO, INC.
Anthonius Ruiter
G01 - MEASURING TESTING