Anthony C. Miller

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Liquid crystal over semiconductor display with on-chip storage
- Patent number 6,980,183
- Issue date Dec 27, 2005
- Intel Corporation
- Scott A. Rosenberg
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Display panel
- Patent number 6,278,428
- Issue date Aug 21, 2001
- Intel Corporation
- Ronald D. Smith
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method to perform IDDQ testing in the presence of high background l...
- Patent number 6,239,606
- Issue date May 29, 2001
- Intel Corporation
- Anthony C. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method to perform IDDQ testing in the presence of high background l...
- Patent number 6,239,605
- Issue date May 29, 2001
- Intel Corporation
- Anthony C. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Aligning electro-optic material having standoffs formed from a four...
- Patent number 6,215,534
- Issue date Apr 10, 2001
- Intel Corporation
- Kannan Raj
- G02 - OPTICS
Information Patent Grant
Metallic standoff for an electro-optical device formed from a fourt...
- Patent number 6,208,392
- Issue date Mar 27, 2001
- Intel Corporation
- Anthony C. Miller
- G02 - OPTICS
Information Patent Grant
Control register bus access through a standardized test access port
- Patent number 6,055,656
- Issue date Apr 25, 2000
- Intel Corporation
- James A. Wilson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting opens through time variant current measurement
- Patent number 5,990,699
- Issue date Nov 23, 1999
- Intel Corporation
- Anthony C. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Delta IDDQ testing
- Patent number 5,889,408
- Issue date Mar 30, 1999
- Intel Corporation
- Anthony C. Miller
- G01 - MEASURING TESTING

Anthony C. Miller

Person

Patents Grantslast 30 patents

Liquid crystal over semiconductor display with on-chip storage

Display panel

Method to perform IDDQ testing in the presence of high background l...

Method to perform IDDQ testing in the presence of high background l...

Aligning electro-optic material having standoffs formed from a four...

Metallic standoff for an electro-optical device formed from a fourt...

Control register bus access through a standardized test access port

Method for detecting opens through time variant current measurement

Delta IDDQ testing