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Anthony F. Andresen
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods for switch health determination
Patent number
10,649,033
Issue date
May 12, 2020
NXP USA, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Wetting current diagnostics
Patent number
10,641,827
Issue date
May 5, 2020
NXP USA, INC.
William E. Edwards
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Wetting current diagnostics
Patent number
10,101,395
Issue date
Oct 16, 2018
NXP USA, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
System and method for switch status detection
Patent number
9,897,633
Issue date
Feb 20, 2018
NXP USA, INC.
William E. Edwards
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for switch status detection
Patent number
9,835,687
Issue date
Dec 5, 2017
NXP USA, INC.
William E. Edwards
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensed switch current control
Patent number
9,778,668
Issue date
Oct 3, 2017
NXP USA, INC.
William E. Edwards
G05 - CONTROLLING REGULATING
Information
Patent Grant
Systems and methods for switch health determination
Patent number
9,778,319
Issue date
Oct 3, 2017
NXP USA, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
State-based undervoltage hysteresis
Patent number
9,715,246
Issue date
Jul 25, 2017
NXP USA, INC.
William E. Edwards
G05 - CONTROLLING REGULATING
Information
Patent Grant
Wetting current diagnostics
Patent number
9,465,075
Issue date
Oct 11, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Switch detection device and method of use
Patent number
9,329,237
Issue date
May 3, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHODS FOR COMMUNICATION OVER MULTIFUNCTION PINS
Publication number
20240257845
Publication date
Aug 1, 2024
MICROCHIP TECHNOLOGY INCORPORATED
Ali Harb
G11 - INFORMATION STORAGE
Information
Patent Application
WETTING CURRENT DIAGNOSTICS
Publication number
20180356466
Publication date
Dec 13, 2018
NXP USA, Inc.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR SWITCH HEALTH DETERMINATION
Publication number
20180031635
Publication date
Feb 1, 2018
NXP USA, Inc.
William E. EDWARDS
G01 - MEASURING TESTING
Information
Patent Application
STATE-BASED UNDERVOLTAGE HYSTERESIS
Publication number
20160282896
Publication date
Sep 29, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G05 - CONTROLLING REGULATING
Information
Patent Application
Wetting Current Diagnostics
Publication number
20160238658
Publication date
Aug 18, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SWITCH STATUS DETECTION
Publication number
20160182033
Publication date
Jun 23, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SWITCH STATUS DETECTION
Publication number
20160178672
Publication date
Jun 23, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SWITCH HEALTH DETERMINATION
Publication number
20160131713
Publication date
May 12, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
SENSED SWITCH CURRENT CONTROL
Publication number
20160091908
Publication date
Mar 31, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G05 - CONTROLLING REGULATING
Information
Patent Application
WETTING CURRENT DIAGNOSTICS
Publication number
20160061898
Publication date
Mar 3, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
SWITCH DETECTION DEVICE AND METHOD OF USE
Publication number
20150198666
Publication date
Jul 16, 2015
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING