Anthony Graupera

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,691,583
- Issue date Jun 27, 2017
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma ion source for use with a focused ion beam column with selec...
- Patent number 9,627,169
- Issue date Apr 18, 2017
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for attachment of an electrode into an inductively-coupled p...
- Patent number 9,530,625
- Issue date Dec 27, 2016
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and structures for rapid switching between different proces...
- Patent number 9,159,534
- Issue date Oct 13, 2015
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,105,438
- Issue date Aug 11, 2015
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively-coupled plasma ion source for use with a focused ion be...
- Patent number 9,087,671
- Issue date Jul 21, 2015
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for attachment of an electrode into a plasma source
- Patent number 9,053,895
- Issue date Jun 9, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Encapsulation of electrodes in solid media
- Patent number 8,987,678
- Issue date Mar 24, 2015
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for attachment of an electrode into an inductively coupled p...
- Patent number 8,928,210
- Issue date Jan 6, 2015
- FEI Comapny
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively-coupled plasma ion source for use with a focused ion be...
- Patent number 8,822,913
- Issue date Sep 2, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-axis detector for charged particle beam system
- Patent number 8,759,764
- Issue date Jun 24, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma igniter for an inductively coupled plasma ion source
- Patent number 8,723,143
- Issue date May 13, 2014
- FEI Company
- Anthony Graupera
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Encapsulation of electrodes in solid media for use in conjunction w...
- Patent number 8,642,974
- Issue date Feb 4, 2014
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and structures for rapid switching between different proces...
- Patent number 8,633,452
- Issue date Jan 21, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system having multiple user-selectable operat...
- Patent number 8,445,870
- Issue date May 21, 2013
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to direct pattern metals on a substrate
- Patent number 8,278,220
- Issue date Oct 2, 2012
- FEI Company
- Theresa Holtermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system having multiple user-selectable operat...
- Patent number 8,253,118
- Issue date Aug 28, 2012
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma igniter for an inductively coupled plasma ion source
- Patent number 8,124,942
- Issue date Feb 28, 2012
- FEI Company
- Anthony Graupera
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
INDUCTIVELY-COUPLED PLASMA ION SOURCE FOR USE WITH A FOCUSED ION BE...
- Publication number 20160027607
- Publication date Jan 28, 2016
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20150380204
- Publication date Dec 31, 2015
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ATTACHMENT OF AN ELECTRODE INTO AN INDUCTIVELY-COUPLED P...
- Publication number 20150357166
- Publication date Dec 10, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDUCTIVELY-COUPLED PLASMA ION SOURCE FOR USE WITH A FOCUSED ION BE...
- Publication number 20150129759
- Publication date May 14, 2015
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Structures for Rapid Switching Between Different Proces...
- Publication number 20140306607
- Publication date Oct 16, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
On-Axis Detector for Charged Particle Beam System
- Publication number 20140001357
- Publication date Jan 2, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20130320229
- Publication date Dec 5, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Actively Monitoring an Inductively-Coupled...
- Publication number 20130250293
- Publication date Sep 26, 2013
- FEI Company
- Mark W. Utlaut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inductively-Coupled Plasma Ion Source for Use with a Focused Ion Be...
- Publication number 20130140450
- Publication date Jun 6, 2013
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Attachment of an Electrode into an Inductively Coupled P...
- Publication number 20130134855
- Publication date May 30, 2013
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Structures for Rapid Switching Between Different Proces...
- Publication number 20130015765
- Publication date Jan 17, 2013
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Encapsulation of Electrodes in Solid Media for use in conjunction w...
- Publication number 20120261587
- Publication date Oct 18, 2012
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM HAVING MULTIPLE USER-SELECTABLE OPERAT...
- Publication number 20120091360
- Publication date Apr 19, 2012
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma Igniter for an Inductively Coupled Plasma Ion Source
- Publication number 20120032092
- Publication date Feb 9, 2012
- FEI Company
- Anthony Graupera
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Encapsulation of Electrodes in Solid Media for use in conjunction w...
- Publication number 20110272592
- Publication date Nov 10, 2011
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Plasma Igniter for an Inductively Coupled Plasma Ion Source
- Publication number 20110198511
- Publication date Aug 18, 2011
- FEI Company
- ANTHONY GRAUPERA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Charged Particle Beam System Having Multiple User-Selectable Operat...
- Publication number 20110084207
- Publication date Apr 14, 2011
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO DIRECT PATTERN METALS ON A SUBSTRATE
- Publication number 20100032302
- Publication date Feb 11, 2010
- FEI Company
- THERESA HOLTERMANN
- H01 - BASIC ELECTRIC ELEMENTS

Anthony Graupera

Person

Patents Grantslast 30 patents

Imaging and processing for plasma ion source

Plasma ion source for use with a focused ion beam column with selec...

Method for attachment of an electrode into an inductively-coupled p...

Methods and structures for rapid switching between different proces...

Imaging and processing for plasma ion source

Inductively-coupled plasma ion source for use with a focused ion be...

System for attachment of an electrode into a plasma source

Encapsulation of electrodes in solid media

System for attachment of an electrode into an inductively coupled p...

Inductively-coupled plasma ion source for use with a focused ion be...

On-axis detector for charged particle beam system

Plasma igniter for an inductively coupled plasma ion source

Encapsulation of electrodes in solid media for use in conjunction w...

Methods and structures for rapid switching between different proces...

Charged particle beam system having multiple user-selectable operat...

Method to direct pattern metals on a substrate

Charged particle beam system having multiple user-selectable operat...

Plasma igniter for an inductively coupled plasma ion source

Patents Applicationslast 30 patents

INDUCTIVELY-COUPLED PLASMA ION SOURCE FOR USE WITH A FOCUSED ION BE...

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

METHOD FOR ATTACHMENT OF AN ELECTRODE INTO AN INDUCTIVELY-COUPLED P...

INDUCTIVELY-COUPLED PLASMA ION SOURCE FOR USE WITH A FOCUSED ION BE...

Methods and Structures for Rapid Switching Between Different Proces...

On-Axis Detector for Charged Particle Beam System

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

Method and Apparatus for Actively Monitoring an Inductively-Coupled...

Inductively-Coupled Plasma Ion Source for Use with a Focused Ion Be...

System for Attachment of an Electrode into an Inductively Coupled P...

Methods and Structures for Rapid Switching Between Different Proces...

Encapsulation of Electrodes in Solid Media for use in conjunction w...

CHARGED PARTICLE BEAM SYSTEM HAVING MULTIPLE USER-SELECTABLE OPERAT...

Plasma Igniter for an Inductively Coupled Plasma Ion Source

Encapsulation of Electrodes in Solid Media for use in conjunction w...

Plasma Igniter for an Inductively Coupled Plasma Ion Source

Charged Particle Beam System Having Multiple User-Selectable Operat...

METHOD TO DIRECT PATTERN METALS ON A SUBSTRATE